CAT5221YI25(2013) 데이터 시트보기 (PDF) - ON Semiconductor

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CAT5221YI25
(Rev.:2013)

Dual Digital Potentiometer (POT) with 64 Taps and I2C Interface

ON Semiconductor 

CAT5221

Table 10. RELIABILITY CHARACTERISTICS (Over recommended operating conditions unless otherwise stated.)

Symbol

Parameter

Reference Test Method

Min

Typ Max

NEND (Note 9)

Endurance

MIL−STD−883, Test Method 1033 1,000,000

TDR (Note 9)

Data Retention

MIL−STD−883, Test Method 1008

100

VZAP (Note 9)

ESD Susceptibility MIL−STD−883, Test Method 3015

2000

ILTH (Notes 9, 10) Latch-Up

JEDEC Standard 17

100

9. This parameter is tested initially and after a design or process change that affects the parameter.

10. tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.

Units

Cycles/Byte

Years

Volts

mA

tF

tHIGH

tR

tLOW

tLOW

SCL

tSU:STA

SDA IN

tHD:STA

tHD:DAT

tSU:DAT

SDA OUT

tAA

tDH

Figure 2. Bus Timing

tSU:STO

tBUF

SCL

SDA

8TH BIT

BYTE n

ACK

tWR

STOP

CONDITION

Figure 3. Write Cycle Timing

START

CONDITION

ADDRESS

SDA

SCL

START BIT

Figure 4. Start/Stop Timing

STOP BIT

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