GAL18V10 데이터 시트보기 (PDF) - Lattice Semiconductor
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GAL18V10 Datasheet PDF : 14 Pages
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Specifications GAL18V10B
Absolute Maximum Ratings(1)
Recommended Operating Conditions
Supply voltage VCC ....................................... -0.5 to +7V
Input voltage applied ........................... -2.5 to VCC +1.0V
Off-state output voltage applied .......... -2.5 to VCC +1.0V
Storage Temperature ................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
Commercial Devices:
Ambient Temperature (TA) ............................. 0 to +75°C
Supply voltage (VCC)
with Respect to Ground ..................... +4.75 to +5.25V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL PARAMETER
CONDITION
MIN. TYP.3 MAX. UNITS
VIL
VIH
IIL1
IIH
VOL
VOH
IOL
IOH
IOS2
Input Low Voltage
Input High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
Output Low Voltage
Output High Voltage
Low Level Output Current
High Level Output Current
Output Short Circuit Current
0V ≤ VIN ≤ VIL (MAX.)
3.5V ≤ VIN ≤ VCC
IOL = MAX. Vin = VIL or VIH
IOH = MAX. Vin = VIL or VIH
VCC = 5V VOUT = 0.5V TA = 25°C
Vss – 0.5 —
2.0
—
—
—
—
—
—
—
2.4
—
—
—
—
—
–30
—
0.8
V
Vcc+1 V
–100 μA
10
μA
0.5
V
—
V
16
mA
–3.2 mA
–130 mA
COMMERCIAL
ICC
Operating Power
Supply Current
VIL = 0.5V VIH = 3.0V
ftoggle = 15MHz Outputs Open
L -7/-10/-15/-20 —
75
115 mA
1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) Typical values are at Vcc = 5V and TA = 25 °C
6
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