HEF4066B 데이터 시트보기 (PDF) - NXP Semiconductors.
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HEF4066B Datasheet PDF : 16 Pages
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NXP Semiconductors
HEF4066B
Quad single-pole single-throw analog switch
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VDD VI
VO
DUT
VDD
RL S1
open
RT
CL
VSS
001aak674
Fig 9.
Test data is given in Table 11.
Definitions:
DUT = Device Under Test.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including test jig and probe.
RL = Load resistance.
Test circuit for measuring switching times
Table 11. Test data
Supply voltage Input
VDD
5 V to 15 V
VI
0 V or VDD
tr, tf
20 ns
Load
CL
50 pF
RL
10 k
S1 position
tPHL, tPLH
VSS
tPZH, tPHZ
VSS
tPZL, tPLZ
VDD
11.2 Additional dynamic parameters
Table 12. Additional dynamic characteristics
VSS = 0 V; Tamb = 25 C.
Symbol
Parameter
Conditions
THD
total harmonic distortion
see Figure 10; RL = 10 k; CL = 15 pF;
channel ON; VI = 0.5VDD (p-p);
fi = 1 kHz
VDD
5V
10 V
15 V
Vct
crosstalk voltage
nE input to switch; see Figure 11;
10 V
RL = 10 k; CL = 15 pF;
nE = VDD (square-wave)
Typ
[1] 0.25
[1] 0.04
[1] 0.04
50
Max
-
-
-
-
Unit
%
%
%
mV
HEF4066B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 16 November 2011
© NXP B.V. 2011. All rights reserved.
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