MC10E451 데이터 시트보기 (PDF) - ON Semiconductor

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MC10E451

5V ECL 6−Bit D Register Differential Data and Clock

ON Semiconductor 

MC10E451, MC100E451

Table 7. AC CHARACTERISTICS VCCx = 5.0 V; VEE = 0.0 V or VCCx = 0.0 V; VEE = −5.0 V (Note 13)

0°C

25°C

85°C

Symbol

Characteristic

Min Typ Max Min Typ Max Min Typ Max Unit

fMAX

Maximum Toggle Frequency

1.1

1.1

1.1

GHz

tPLH

Propagation Delay to Output

tPHL

CLK (Differential), CLK (Single−Ended), MR 625

1050 625

1050 625

ps

1050

ts

Setup Time

th

Hold Time

tRR

Reset Recovery Time

tPW

Minimum Pulse Width

D 150 −100

150 −100

150 −100

ps

D 250 100

250 100

250 100

ps

750 600

750 600

750 600

ps

ps

CLK, MR 400

400

400

tSKEW

tJITTER

Within−Device Skew (Note 14)

Random Clock Jitter (RMS)

100

100

100

ps

<1.0

<1.0

<1.0

ps

VPP

Input Voltage Swing (Differential Configuration)

150

1000 150

1000 150

1000 mV

tr

Rise/Fall Times

tf

ps

(20 − 80%) 275 450 800 275 450 800 275 450 800

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification

limit values are applied individually under normal operating conditions and not valid simultaneously.

13. 10 Series: VEE can vary −0.46 V / +0.06 V.

100 Series: VEE can vary −0.46 V / +0.8 V.

14. Within−device skew is defined as identical transitions on similar paths through a device.

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