MX26C1000A 데이터 시트보기 (PDF) - Macronix International

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MX26C1000A

1M-BIT [128K x 8] CMOS MULTIPLE-TIME-PROGRAMMABLE-EPROM

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE

UNDER

TEST

CL

6.2K ohm

MX26C1000A

1.8K ohm

+5V

DIODES = IN3064

OR EQUIVALENT

CL = 100 pF including jig capacitance(30pF for 70 ns parts)

SWITCHING TEST WAVEFORMS

3.0V

1.5V

TEST POINTS

1.5V

0V

INPUT

OUTPUT

AC TESTING: (1) Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0".

Input pulse rise and fall times are < 10ns.

(2) For MX26C1000A

P/N: PM0454 Patent#: US#5,526,307

7

REV.1.5, FEB 10, 1998

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