BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.1.9_00
Table 9
S-8261AAU, S-8261AAX, S-8261ABA
Parameter
Symbol
Test
condition
Remark
Min.
Typ. Max.
Unit
Test
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
tCU
9
3.7 4.6 5.5 s
5
Overdischarge detection delay time tDL
9
115 144 173 ms 5
Overcurrent 1 detection delay time tlOV1
10
7.2 9 11 ms 5
Overcurrent 2 detection delay time tlOV2
10
Load short-circuiting detection delay
time
tSHORT
10
[DELAY TIME] −40 °C to +85 °C*1
1.8 2.24 2.7 ms 5
220 320 380 µs 5
Overcharge detection delay time
tCU
9
2.5 4.6 7.8 s
5
Overdischarge detection delay time tDL
9
80 144 245 ms 5
Overcurrent 1 detection delay time tlOV1
10
5 9 15 ms 5
Overcurrent 2 detection delay time tlOV2
10
Load short-circuiting detection delay
time
tSHORT
10
1.2 2.24 3.8 ms 5
150 320 540 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
Table 10
S-8261AAV
Parameter
Symbol
Test
condition
Remark
Min.
Typ. Max.
Unit
Test
circuit
[DELAY TIME] 25 °C
Overcharge detection delay time
tCU
9
3.7 4.6 5.5 s
5
Overdischarge detection delay time tDL
9
115 144 173 ms 5
Overcurrent 1 detection delay time tlOV1
10
7.2 9 11 ms 5
Overcurrent 2 detection delay time tlOV2
10
Load short-circuiting detection delay
time
tSHORT
10
[DELAY TIME] −40 °C to +85 °C*1
3.6 4.5 5.4 ms 5
450 600 720 µs 5
Overcharge detection delay time
tCU
9
2.5 4.6 7.8 s
5
Overdischarge detection delay time tDL
9
80 144 245 ms 5
Overcurrent 1 detection delay time tlOV1
10
5 9 15 ms 5
Overcurrent 2 detection delay time tlOV2
10
Load short-circuiting detection delay
time
tSHORT
10
2.5 4.5 7.7 ms 5
310 600 1020 µs 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
is guaranteed by design, not tested in production.
12
Seiko Instruments Inc.