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T810H-6T-TR 데이터 시트보기 (PDF) - STMicroelectronics

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T810H-6T-TR
ST-Microelectronics
STMicroelectronics 
T810H-6T-TR Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
T810H
Characteristics
Figure 9.
On-state characteristics (maximum Figure 10. Relative variation of critical rate of
values)
decrease of main current versus
junction temperature
ITM (A)
100
(dI/dt)C [Tj] / (dI/dt)c [Tj=150 °C]
15
Tj max
14
Vto = 0.80 V
13
Rd = 55 mΩ
12
11
10
9
8
10
7
Tj=150 °C
6
5
Tj=25 °C
4
3
VTM (V)
1
2
1
Tj(°C)
0
0
1
2
3
4
5
25
50
75
100
125
150
Figure 11. Relative variation of critical rate of Figure 12. Relative variation of static dV/dt
decrease of main current versus
immunity versus junction
reapplied dV/dt (typical values)
temperature
(dI/dt)c [ (dV/dt)c ] / Specified (dI/dt)c
4
3
2
1
0
0.1
(dV/dt)C (V/µs)
1.0
10.0
100.0
dV/dt [Tj] / dV/dt [Tj=150 °C]
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
25
50
75
Tj(°C)
100
VD=VR=400 V
125
150
Figure 13. Variation of leakage current versus Figure 14. Acceptable case to ambient thermal
junction temperature for different
resistance versus repetitive peak
values of blocking voltage
off-state voltage
IDRM/IRRM [Tj;V DRM/VRRM]/IDRM/IRRM [Tj=150°C; 600V]
1.0E+00
VDRM=VRRM=600 V
1.0E-01
VDRM=VRRM=400 V
1.0E-02
VDRM=VRRM=200 V
1.0E-03
1.0E-04
Tj(°C)
25
50
75
100
125
150
Rth(c-a) (°C/W)
60
55
50
45
40
35
30
25
20
15
10
5
0
200
300
Rth(j-c)=1.6 °C/W
TJ=150 °C
VAC PEAK(V)
400
500
600
Doc ID 15714 Rev 1
5/10

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