SPT7730 데이터 시트보기 (PDF) - Fairchild Semiconductor

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SPT7730

8-BIT, 3.0 MSPS, SERIAL OUTPUT A/D CONVERTER

Fairchild Semiconductor 

ELECTRICAL SPECIFICATIONS

TA = +25 °C, VDD = +5.0 V, VIN = 0 to +3 V, fCLK = 36 MHz, fS = 3.0 MSPS, VREF+ = +3.0 V, VREF- = 0.0 V, unless otherwise specified.

PARAMETERS

Dynamic Performance

Effective Number of Bits

fIN = 500 kHz

Signal-to-Noise Ratio

fIN = 500 kHz

Harmonic Distortion

fIN = 500 kHz

Power Supply Requirements3

+VDD Supply Voltage

+VDD Supply Current

Power Dissipation

3Excluding the reference ladder.

TEST

CONDITIONS

VDD = 3.0 V

VDD = 5.0 V

VDD = 3.0 V

VDD = 5.0 V

TEST

LEVEL

MIN

IV

IV

IV

IV

3

IV

I

IV

I

TYP

MAX UNITS

7.5

Bits

47

dB

60

dB

5.5 V

5.4

7 mA

9

10 mA

16

22 mW

45

50 mW

TEST LEVEL CODES

TEST LEVEL

All electrical characteristics are subject to the

I

following conditions:

II

All parameters having min/max specifications

are guaranteed. The Test Level column indi-

III

cates the specific device testing actually per-

IV

formed during production and Quality Assur-

ance inspection. Any blank section in the data

V

column indicates that the specification is not

tested at the specified condition.

VI

TEST PROCEDURE

100% production tested at the specified temperature.

100% production tested at TA=25 °C, and sample

tested at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design

and characterization data.

Parameter is a typical value for information purposes

only.

100% production tested at TA = 25 °C. Parameter is

guaranteed over specified temperature range.

SPT7730

3

12/19/97

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