FOD8333 데이터 시트보기 (PDF) - Fairchild Semiconductor

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FOD8333

Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, Active Miller Clamp, and Automatic Fault Reset

Fairchild Semiconductor 

Test Circuits (Continued)

VCC

+

–

4.7k Ω

0.1µF

10mA

FOD8333

1 GND

VE 16

2 VCC

VLED2+ 15

8V

0V

3 FAULT

4 GND

DESAT 14

VDD 13

VDESAT

ICHG

IDSCHG

5 VLED1–

6 VLED1+

VSS 12

VO 11

30V

+

–

7 VLED1+

VCLAMP 10

8 VLED1–

VSS 9

0.1µF

0.1µF

+

–

VE

0.1µF

Figure 39. DESAT Threshold (VDESAT), Blanking Capacitor Charge Current (ICHG),

Blanking Capacitor Discharge Current (IDSCHG) Test Circuit

10mA

FOD8333

1 GND

VE 16

2 VCC

3 FAULT

VLED2+ 15

DESAT 14

0.1µF

4 GND

5 VLED1–

6 VLED1+

7 VLED1+

VDD 13

VSS 12

VO

VO 11

VCLAMP 10

+

15V

–

0V

0V

VUVLO+ VUVLO–

0.1µF

0.1µF

+

–

VE

8 VLED1–

VSS 9

Figure 40. Under-Voltage Lockout Threshold (VUVLO+ / VUVLO-), Under-Voltage Lockout Threshold

Hysteresis (UVLOHYS) Test Circuit

10mA

0A

FOD8333

1 GND

VE 16

2 VCC

VLED2+ 15

3 FAULT

DESAT 14

4 GND

5 VLED1–

6 VLED1+

7 VLED1+

8 VLED1–

VDD 13

VSS 12

VO 11

30V

+

–

50Ω

VCLAMP

10

VTCLAMP

+

–

5V

0V

VSS 9

0.1µF

0.1µF

+

–

VE

0.1µF

Figure 41. Clamping Threshold Voltage (VCLAMP_THRES) Test Circuit

©2014 Fairchild Semiconductor Corporation

FOD8333 Rev. 1.0.3

20

www.fairchildsemi.com

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