ZXMN10A08E6
ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated).
PARAMETER
SYMBOL
STATIC
Drain-Source Breakdown Voltage
V(BR)DSS
Zero Gate Voltage Drain Current
IDSS
Gate-Body Leakage
IGSS
Gate-Source Threshold Voltage
VGS(th)
Static Drain-Source On-State Resistance RDS(on)
(1)
Forward Transconductance (1)(3)
gfs
DYNAMIC (3)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
SWITCHING(2) (3)
Ciss
Coss
Crss
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Gate Charge
td(on)
tr
td(off)
tf
Qg
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
SOURCE-DRAIN DIODE
Diode Forward Voltage (1)
Qg
Qgs
Qgd
VSD
Reverse Recovery Time (3)
trr
Reverse Recovery Charge (3)
Qrr
MIN.
100
2.0
TYP. MAX. UNIT CONDITIONS.
V ID=250A, VGS=0V
0.5 A VDS=100V, VGS=0V
100 nA VGS=Ϯ20V, VDS=0V
V ID=250A, VDS= VGS
0.25 ⍀ VGS=10V, ID=3.2A
0.30 ⍀ VGS=6V, ID=2.6A
5.0
S VDS=15V,ID=3.2A
405
pF
28.2
pF
VDS=50 V, VGS=0V,
f=1MHz
14.2
pF
3.4
ns
2.2
ns VDD =30V, ID=1.2A
8
ns RG≅6.0⍀, VGS=10V
3.2
ns
4.2
nC VDS=50V,VGS=5V,
ID=1.2A
7.7
nC
1.8
nC
VDS=50V,VGS=10V,
ID=1.2A
2.1
nC
0.87 0.95
27
32
V TJ=25°C, IS=3.2A,
VGS=0V
ns TJ=25°C, IF=1.2A,
nC di/dt= 100A/s
NOTES
(1) Measured under pulsed conditions. Width = 300µs. Duty cycle ≤ 2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 5 - JANUARY 2005
SEMICONDUCTORS
4