MK10DX64VMP12 데이터 시트보기 (PDF) - NXP Semiconductors.
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MK10DX64VMP12 Datasheet PDF : 75 Pages
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6.4.1.4
Peripheral operating requirements and behaviors
Reliability specifications
Table 23. NVM reliability specifications
Symbol Description
tnvmretp10k
tnvmretp1k
nnvmcycp
Data retention after up to 10 K cycles
Data retention after up to 1 K cycles
Cycling endurance
Min.
Program Flash
5
20
10 K
Typ.1
50
100
50 K
Max.
—
—
—
Unit
years
years
cycles
Notes
2
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25°C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering
Bulletin EB619.
2. Cycling endurance represents number of program/erase cycles at -40°C ≤ Tj ≤ 125°C.
6.4.2 EzPort switching specifications
Table 24. EzPort switching specifications
Num
EP1
EP1a
EP2
EP3
EP4
EP5
EP6
EP7
EP8
EP9
Description
Operating voltage
EZP_CK frequency of operation (all commands except
READ)
EZP_CK frequency of operation (READ command)
EZP_CS negation to next EZP_CS assertion
EZP_CS input valid to EZP_CK high (setup)
EZP_CK high to EZP_CS input invalid (hold)
EZP_D input valid to EZP_CK high (setup)
EZP_CK high to EZP_D input invalid (hold)
EZP_CK low to EZP_Q output valid
EZP_CK low to EZP_Q output invalid (hold)
EZP_CS negation to EZP_Q tri-state
Min.
1.71
—
—
2 x tEZP_CK
5
5
2
5
—
0
—
Max.
3.6
fSYS/2
fSYS/8
—
—
—
—
—
16
—
12
Unit
V
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
K10 Sub-Family Data Sheet, Rev. 3, 6/2013.
Freescale Semiconductor, Inc.
33
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