ICS844256D Data Sheet
FEMTOCLOCK® CRYSTAL-TO-LVDS FREQUENCY SYNTHESIZER W/INTEGRATED FANOUT BUFFER
Table 4C. LVCMOS/LVTTL DC Characteristics, VDD = 3.3V ± 5%, VDDO = 3.3V ± 5% or 2.5V ± 5%, TA = 0°C to 70°C
Symbol Parameter
Test Conditions
Minimum Typical Maximum Units
VIH
Input High Voltage
2
VIL
Input Low Voltage
-0.3
FB_SEL
VDD = VIN = 3.465V
IIH
Input High Current
PLL_BYPASS,
N_SEL0, N_SEL1
VDD = VIN = 3.465V
VDD + 0.3
V
0.8
V
150
µA
5
µA
FB_SEL
VDD = 3.465V, VIN = 0V
-5
µA
IIL
Input Low Current
PLL_BYPASS,
N_SEL0, N_SEL1
VDD = 3.465V, VIN = 0V
-150
µA
Table 4D. LVDS DC Characteristics, VDD = VDDO = 3.3V ± 5%, TA = 0°C to 70°C
Symbol Parameter
Test Conditions
Minimum
VOD
∆VOD
VOS
∆VOS
Differential Output Voltage
VOD Magnitude Change
Offset Voltage
VOS Magnitude Change
247
1.125
Typical
350
1.25
Maximum
454
50
1.45
50
Units
mV
mV
V
mV
Table 4E. LVDS DC Characteristics, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = 0°C to 70°C
Symbol Parameter
Test Conditions
Minimum Typical
VOD
∆VOD
VOS
∆VOS
Differential Output Voltage
VOD Magnitude Change
Offset Voltage
VOS Magnitude Change
247
350
1.125
1.25
Maximum
454
50
1.45
50
Units
mV
mV
V
mV
Table 5. Crystal Characteristics
Parameter
Test Conditions
Mode of Oscillation
Frequency
Equivalent Series Resistance (ESR)
Shunt Capacitance
Drive Level
NOTE: Characterized using an 18pF parallel resonant crystal.
Minimum Typical Maximum
Fundamental
15.625
25.5
50
7
1
Units
MHz
Ω
pF
mW
ICS844256DG REVISION A AUGUST 5, 2010
5
©2010 Integrated Device Technology, Inc.