PMBT2222,235 데이터 시트보기 (PDF) - NXP Semiconductors.

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PMBT2222,235

NPN switching transistors

NXP Semiconductors. 

NXP Semiconductors

8. Test information

IB

90 %

10 %

IC

90 %

PMBT2222; PMBT2222A

NPN switching transistors

IBon (100 %)

input pulse

(idealized waveform)

IBoff

output pulse

(idealized waveform)

IC (100 %)

10 %

td

tr

ton

Fig 1. Switching time definition

VBB

VCC

ts

toff

t

tf

006aaa003

(probe)

oscilloscope

450 Ω

VI

RB

R2

R1

RC

Vo (probe)

oscilloscope

450 Ω

DUT

mlb826

VCC = 10 V; IC = 150 mA; IBon = 15 mA; IBoff = −15 mA

Fig 2. Test circuit for switching times

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

PMBT2222_PMBT2222A

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 6 — 12 November 2010

© NXP B.V. 2010. All rights reserved.

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