LTC1440(RevC) View Datasheet(PDF) - Linear Technology
Part Name
Description
Manufacturer
LTC1440 Datasheet PDF : 16 Pages
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LTC1440/LTC1441/LTC1442
ELECTRICAL CHARACTERISTICS The ● denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at TA = 25°C. V + = 3V and V – = GND = 0V unless otherwise noted.
SYMBOL PARAMETER
CONDITIONS
MIN TYP MAX UNITS
Power Supply
V+
Supply Voltage Range
●
2
11
V
ICC
Supply Current
Comparator
IN + = IN – + 80mV
HYST = REF (LTC1440/LTC1442)
LTC1440 0°C ≤ TA ≤ 70°C ●
–40°C ≤ TA ≤ 85°C ●
LTC1441
●
LTC1442
●
2
3.9
µA
4.3
µA
3.5
5.7
µA
3.5
5.7
µA
VOS
IIN
VCM
CMRR
PSRR
Comparator Input Offset Voltage
Input Leakage Current (IN +, IN –)
Input Leakage Current (HYST)
Comparator Input Common
Mode Range
Common Mode Rejection Ratio
Power Supply Rejection Ratio
VCM = 1.5V
VIN + = VIN – = 1.5V
V – to V + – 1.3V
V + = 2V to 11V (LTC1441)
V + = 2.5V to 11V (LTC1440/LTC1442)
●
±3
±10
mV
●
±0.01 ±1
nA
●
±0.02 ±1
nA
●
V–
V + – 1.3V
V
0.1
1
mV/V
0.1
1
mV/V
0.1
1
mV/V
NOISE
VHYST
tPD
Voltage Noise
Hysteresis Input Voltage Range
Propagation Delay
VOH
Output High Voltage
Comparator
100Hz to 100kHz
LTC1440/LTC1442
COUT = 100pF
IO = – 8mA
Overdrive = 10mV
Overdrive = 100mV
100
● REF – 50mV
14
5
● V + – 0.4V
µVRMS
REF
V
µs
µs
V
VOL
Output Low Voltage
Reference
IO = 0.8mA
LTC1440
●
LTC1441/LTC1442
●
GND + 0.4V V
V – + 0.4V
V
VREF Reference Voltage
No Load
LTC1440/LTC1442
0°C ≤ TA ≤ 70°C
–40°C ≤ TA ≤ 85°C
● 1.170 1.182 1.194
V
● 1.164
1.200
V
LTC1440 (MSOP, DFN) ● 1.164
1.200
V
ISOURCE Reference Output Source Current ∆VREF ≤ 1mV (LTC1442)
●
60
120
µA
ISINK Reference Output Sink Current ∆VREF ≤ 2.5mV (LTC1442)
10
20
µA
∆VREF Reference Source Current
0 ≤ ISOURCE ≤ 1mA (LTC1440)
●
0.8
5.5
mV
Reference Sink Current
0 ≤ ISINK ≤ 10µA (LTC1440)
0.5
1.5
mV
●
5
mV
NOISE Voltage Noise
100Hz to 100kHz
100
µVRMS
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
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