UT06MRA250 View Datasheet(PDF) - Aeroflex UTMC

Part Name

Description

Manufacturer

UT06MRA250

UT0.6µCRH Commercial RadHard™ Gate Array Family

Aeroflex UTMC 

PHYSICAL DESIGN

Using three layers of metal interconnect, Aeroflex achieves

optimized layouts that maximize speed of critical nets, overall

chip performance, and design density up to 500,000 equivalent

gates.

Test Capability

Aeroflex supports all phases of test development from test stim-

ulus generation through high-speed production test. This

support includes ATPG, fault simulation, and fault grading. Scan

design options are available on all UT0.6CRH storage ele-

ments. Automatic test program development capabilities handle

large vector sets for use with Aeroflex’s Teradyne Tiger tester

supporting high-speed testing (up to 1.2GHz with pin

multiplexing).

Unparalleled Quality and Reliability

Aeroflex is dedicated to meeting the stringent performance re-

quirements of aerospace and defense systems suppliers.

Aeroflex maintains the highest level of quality and reliability

through our Quality Management Program under MIL-PRF-

38535 and ISO-9001. In 1988, we were the first gate array man-

ufacturer to achieve QPL certification and qualification of our

technology families. Our product assurance program has kept

pace with the demands of certification and qualification.

Our quality management plan includes the following activities

and initiatives.

 Quality improvement plan

 Failure analysis program

 SPC plan

 Corrective action plan

 Change control program

 Standard Evaluation Circuit (SEC) and Technology Charac-

terization Vehicle (TCV) assessment program

 Certification and qualification program

Because of numerous product variations permitted with custom-

er specific designs, much of the reliability testing is performed

using a Standard Evaluation Circuit (SEC) and Technology

Characterization Vehicle (TCV). The TCV utilizes test struc-

tures to evaluate hot carrier aging, electromigration, and time

dependent test samples for reliability testing. Data from the wa-

fer-level testing can provide rapid feedback to the fabrication

process, as well as establish the reliability performance of the

product before it is packaged and shipped.

Radiation Tolerance

Aeroflex incorporates radiation-tolerance techniques in process

design, design rules, array design, power distribution, and li-

brary element design. All key radiation-tolerance process

parameters are controlled and monitored using statistical meth-

ods and in-line testing.

PARAMETER

Total dose

Dose rate upset

Dose rate

survivability

SEU

Projected

neutron fluence

Latchup

RADIATION

TOLERANCE

1.0E5 rad(SiO2)

3.0E5 rad(SiO2)

1.0E8 rad(Si)/sec

1.0E11 rad(Si)/sec

NOTES

1

2

3

4

<2.0E-10 errors per cell-day

4, 5

1.0E14 n/sq cm

Latchup-immune over speci-

fied use conditions

Notes:

1. Total dose Co-60 testing is in accordance with MIL-STD-883,

Method 1019. Data sheet electrical characteristics guaranteed to 1.0E5

rads(SiO2). All post-radiation values measured at 25C.

2. Total dose Co-60 testing is in accordance with MIL-STD-883,

Method 1019 at dose rates <1 rad(SiO2)/s.

3. Short pulse 20ns FWHM (full width, half maximum).

4. Is design dependent; SEU limit based on standard evaluation circuit at 4.5V

worst case condition.

5. SEU-hard flip-flop cell. Non-hard flip-flop typical is 4E-8.

8

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