25VF080 View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
Manufacturer
25VF080 Datasheet PDF : 23 Pages
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8 Mbit SPI Serial Flash
SST25VF080
Advance Information
TABLE 9: CAPACITANCE (Ta = 25°C, f=1 Mhz, other pins open)
Parameter
Description
Test Condition
Maximum
COUT1
CIN1
Output Pin Capacitance
Input Capacitance
VOUT = 0V
VIN = 0V
12 pF
6 pF
T9.0 1250
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 10: RELIABILITY CHARACTERISTICS
Symbol
Parameter
Minimum Specification Units Test Method
NEND1
Endurance
10,000
Cycles JEDEC Standard A117
TDR1
Data Retention
100
Years JEDEC Standard A103
ILTH1
Latch Up
100 + IDD
mA JEDEC Standard 78
T10.0 1250
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 11: AC OPERATING CHARACTERISTICS
Symbol
FCLK
TSCKH
TSCKL
TCES1
TCEH1
TCHS1
TCHH1
TCPH
TCHZ
TCLZ
TDS
TDH
THLS
THHS
THLH
THHH
THZ
TLZ
TOH
TV
TSE
TBE
TSCE
TBP
Parameter
Serial Clock Frequency
Serial Clock High Time
Serial Clock Low Time
CE# Active Setup Time
CE# Active Hold Time
CE# Not Active Setup Time
CE# Not Active Hold Time
CE# High Time
CE# High to High-Z Output
SCK Low to Low-Z Output
Data In Setup Time
Data In Hold Time
HOLD# Low Setup Time
HOLD# High Setup Time
HOLD# Low Hold Time
HOLD# High Hold Time
HOLD# Low to High-Z Output
HOLD# High to Low-Z Output
Output Hold from SCK Change
Output Valid from SCK
Sector-Erase
Block-Erase
Chip-Erase
Byte-Program
1. Relative to SCK.
Min
Max
Units
20
MHz
20
ns
20
ns
20
ns
20
ns
10
ns
10
ns
100
ns
20
ns
0
ns
5
ns
5
ns
10
ns
10
ns
15
ns
10
ns
20
ns
20
ns
0
ns
20
ns
25
ms
25
ms
100
ms
20
µs
T11.0 1250
©2003 Silicon Storage Technology, Inc.
18
S71250-00-000
10/03
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