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DCR504ST View Datasheet(PDF) - Dynex Semiconductor

Part Name
Description
Manufacturer
DCR504ST
Dynex
Dynex Semiconductor Dynex
DCR504ST Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
DCR504ST
10000
IT
tp
dIT/dt
QR
0.25xIRM
IRM
1000
100
Conditions:
Tj = 125˚C
VR = 50V
tp = 1ms
IT = 300A
10
Upper limit 95%
100
0.1
1.0
10
100
Rate of decay of on-state current, dIT/dt - (A/µs)
Fig.4 Recovered charge
1.0
1
VGD
Lower limit 5%
Region of certain
triggering
0.1
0.001
0.01
0.1
1
Gate trigger current, IGT - (A)
10
IFGM
Fig.5 Gate characteristics
20
I2t = Î2 x t
2
15
Anode side cooled
0.1
Double side cooled
10
150
0.01
0.001
0.001
0.01
Conduction Effective thermal resistance
Junction to case ˚C/W
Double side
d.c.
0.063
Halfwave
0.073
3 phase 120˚ 0.093
6 phase 60˚ 0.112
Anode side
0.11
0.12
0.14
0.16
0.1
1
10
Time - (s)
Fig.6 Maximum (limit) transient thermal impedance -
junction to case
I2t
5
100
0
50
1
10 1 2 3 45 10 20 30 50
ms
Cycles at 50Hz
Duration
Fig.7 Surge (non-repetitive) on-state current vs time (with
50% VRRM at Tcase 125˚C)
6/8
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