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DCR3790B35 View Datasheet(PDF) - Dynex Semiconductor

Part Name
Description
Manufacturer
DCR3790B35
Dynex
Dynex Semiconductor Dynex
DCR3790B35 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
SEMICONDUCTOR
DCR3790B42
DYNAMIC CHARACTERISTICS
Symbol
Parameter
Test Conditions
Min. Max. Units
IRRM/IDRM Peak reverse and off-state current
At VRRM/VDRM, Tcase = 125°C
dV/dt Max. linear rate of rise of off-state voltage To 67% VDRM, Tj = 125°C, gate open
dI/dt Rate of rise of on-state current
From 67% VDRM to 2x IT(AV) Repetitive 50Hz
Gate source 30V, 10,
Non-repetitive
tr < 0.5µs, Tj = 125°C
VT(TO) Threshold voltage Low level
700A to 4100A at Tcase = 125°C
Threshold voltage High level
4100A to 12000A at Tcase = 125°C
rT
On-state slope resistance Low level
700A to 4100A at Tcase = 125°C
On-state slope resistance High level
4100A to 12000A at Tcase = 125°C
tgd
Delay time
VD = 67% VDRM, gate source 30V, 10
tr = 0.5µs, Tj = 25°C
tq
Turn-off time
Tj = 125°C, VR = 200V, dI/dt = 1A/µs,
dVDR/dt = 20V/µs linear
QS
Stored charge
IT = 2000A, Tj = 125°C, dI/dt 1A/µs,
IL
Latching current
Tj = 25°C, VD = 5V
-
-
-
-
-
-
-
-
TBD
250
1500
-
200
1500
200
400
0.83
1.0
0.1688
0.1263
TBD
500
4500
3
mA
V/µs
A/µs
A/µs
V
V
m
m
µs
µs
µC
A
IH
Holding current
Tj = 25°C, RG-K = , ITM = 500A, IT = 5A
-
300
mA
3/10
www.dynexsemi.com

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