DAC16GS View Datasheet(PDF) - Analog Devices
Part Name
Description
Manufacturer
DAC16GS Datasheet PDF : 12 Pages
| |||
DAC16–SPECIFICATIONS
ELECTRICAL CHARACTERISTICS (@ VCC = +5.0 V, VEE = –15.0 V, IREF = 0.5 mA, CCOMP = 47 F, TA = Full Operating Tem-
perature Range unless otherwise noted. See Note 1 for supply variations.)
Parameter
Conditions
Min Typ Max
Units
Integral Linearity “G”
Integral Linearity “G”
Differential Linearity “G”
Differential Linearity “G”
Integral Linearity “F”
Integral Linearity “F”
Differential Linearity “F”
Differential Linearity “F”
Zero Scale Error
Zero Scale Drift
Gain Error
Gain Drift
REFERENCE2
Reference Input Current
INL
INL
DNL
DNL
INL
INL
DNL
DNL
ZSE
TCZSE
GE
TCGE
TA = +25°C
TA = +25°C
TA = +25°C
TA = +25°C
IREF Note 2
–2
± 1.2 +2
LSB
–4
± 1.6 +4
LSB
–1
± 0.5 +1
LSB
–1
± 0.7 +1.5
LSB
–4
± 1.4 +4
LSB
–6
± 2 +6
LSB
–1
± 0.5 +1.5
LSB
–1.5 ± 0.6 +2
LSB
1
LSB
0.025
ppm/°C
± 0.225 % FS
5
ppm/°C
350
625
µA
OUTPUT CHARACTERISTICS
Output Current
Output Capacitance
Settling Time
IOUT
COUT
tS
Note 2
0.003% of Full Scale
2.8
5.0
mA
10
pF
500
ns
LOGIC CHARACTERISTICS
Logic Input High Voltage
Logic Input Low Voltage
Logic Input Current
Logic Input Current
Logic Input Current
Input Capacitance
VINH
VINL
IINH
IINH
IINL
CIN
TA = +25°C
TA = +25°C
VIN = 5.0 V, DB0–DB10
VIN = 5.0 V, DB11–DB15
VIN = 0 V, DB0–DB15
2.4
V
0.8
V
7.5
µA
100
µA
1
µA
8
pF
SUPPLY CHARACTERISTICS
Power Supply Sensitivity
Positive Supply Current
Positive Supply Current
Negative Supply Current
Power Dissipation
PSS
ICC
ICC
IEE
PDISS
VCC = 4.5 V to 5.5 V, VEE = –13 V to –17 V
All Bits HIGH
All Bits LOW
20
15 22
6
7.5
7.5 10
188 260
ppm/V
mA
mA
mA
mW
NOTES
1All supplies can be varied ± 5% and operation is guaranteed. Device is tested with nominal supplies.
2Operation is guaranteed over this reference range, but linearity is neither tested not guaranteed (see Figures 7 and 8).
Specifications subject to change without notice.
WAFER TEST LIMITS (@ VCC = +5.0 V, VEE = –15.0 V, IREF = 0.5 mA, CCOMP = 47 F, TA = +25؇C unless otherwise noted.)
Parameter
Symbol
Conditions
DAC16G
Limit
Units
Integral Nonlinearity
Differential Nonlinearity
Zero Scale Error
Gain Error
Logic Input High Voltage
Logic Input Low Voltage
Logic Input Current
Positive Supply Current
Negative Supply Current
Power Dissipation
INL
DNL
ZSE
GE
VINH
VINL
IIN
ICC
IEE
PDISS
±3
LSB max
±1
LSB max
±1
LSB max
± 12
% FS max
2.4
V min
0.8
V max
75
µA max
20
mA max
10
mA max
250
mW max
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
–2–
REV. B
Share Link: 