SST25VF010 View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
Manufacturer
SST25VF010 Datasheet PDF : 22 Pages
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1 Mbit SPI Serial Flash
SST25VF010
Data Sheet
TABLE 10: RELIABILITY CHARACTERISTICS
Symbol
Parameter
Minimum Specification Units Test Method
NEND1
TDR1
Endurance
Data Retention
10,000
100
Cycles JEDEC Standard A117
Years JEDEC Standard A103
ILTH1
Latch Up
100 + IDD
mA JEDEC Standard 78
T10.0 1233
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 11: AC OPERATING CHARACTERISTICS VDD = 2.7-3.6V
Symbol
Parameter
Min
FCLK
Serial Clock Frequency
TSCKH
Serial Clock High Time
20
TSCKL
Serial Clock Low Time
20
TSCKR
Serial Clock Rise Time
TSCKF
Serial Clock Fall Time
TCES1
CE# Active Setup Time
20
TCEH1
CE# Active Hold Time
20
TCHS1
CE# Not Active Setup Time
10
TCHH1
CE# Not Active Hold Time
10
TCPH
CE# High Time
100
TCHZ
CE# High to High-Z Output
TCLZ
SCK Low to Low-Z Output
0
TDS
Data In Setup Time
5
TDH
Data In Hold Time
5
THLS
HOLD# Low Setup Time
10
THHS
HOLD# High Setup Time
10
THLH
HOLD# Low Hold Time
15
THHH
HOLD# High Hold Time
10
THZ
HOLD# Low to High-Z Output
TLZ
HOLD# High to Low-Z Output
TOH
Output Hold from SCK Change
0
TV
Output Valid from SCK
TSE
Sector-Erase
TBE
Block-Erase
TSCE
TBP
Chip-Erase
Byte-Program
1. Relative to SCK.
Limits
Max
20
5
5
20
20
20
20
25
25
100
20
Units
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ms
ms
µs
T11.1 1233
©2003 Silicon Storage Technology, Inc.
16
S71233-01-000
8/03
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