T2526(2003) View Datasheet(PDF) - Atmel Corporation

Part Name

Description

Manufacturer

T2526
(Rev.:2003)

Low-voltage IR Receiver ASSP

Atmel Corporation 

T2526

Electrical Characteristics, 5-V Operation (Continued)

Tamb = 25°C, VS = 5 V unless otherwise specified.

No. Parameters

Test Conditions

Pin Symbol Min. Typ. Max. Unit Type*

Min. detection threshold Test signal:

7.3 current

See Figure 11 on page 9

3

See Figure 4 on page 6 VS = 5 V

Tamb = 25°C

Min. detection threshold

current with AC current

IIN_DC = 1µA

square pp

7.4 disturbance IIN_AC100 = burst N = 16

3

3 µA at 100 Hz

f = f0; tPER = 10 ms

Figure 10 on page 8

BER = 50(2)

IEemin

IEemin

-890

-2500

pA

B

pA

C

Test signal:

See Figure 11 on page 9

VS = 5 V, Tamb = 25°C

7.5

Max. detection threshold

current with VIN > 0V

IIN_DC = 1µA

square pp

burst N = 16

3

f = f0; tPER = 10 ms

Figure 10 on page 8

BER = 5%(2)

IEemax

-500

µA

D

8 Controlled Amplifier and Filter

8.1

Maximum value of

variable gain (CGA)

GVARMAX

51

dB

D

8.2

Minimum value of variable

gain (CGA)

GVARMIN

-5

dB

D

8.3

Total internal

amplification(3)

GMAX

71

dB

D

Resulting center

8.4 frequency fusing

accuracy

f0 fused at VS = 3 V

VS = 5 V, Tamb = 25°C

f05V

f03V-FUSE

+ 0.5

%

A

*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter

Notes: 1. Depending on version, see “Ordering Information”

2. BER = bit error rate; e.g., BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the pin OUT

3. After transformation of input current into voltage

ESD

All pins Þ 2000V HBM; 200V MM, MIL-STD-883C, Method 3015.7

Reliability

Electrical qualification (1000h) in molded SO8 plastic package

5

4597C–AUTO–11/03

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