Test Circuits (Continued)
FOD2200
A
1
VCC 8
B
2
7
RIN
3
6
VFF
4
PULSE GENERATOR +
5
GND
VCM
–
VCC
OUTPUT VO
MONITORING
NODE
0.1 µF
BYPASS
VCM
0V
VOH
OUTPUT
VO
VOL
50 V
SWITCH AT A: I F = 1.6mA
VO (MIN.)*
SWITCH AT B: I F = 0mA
VO (MAX.)*
* SEE NOTE 6.
Fig. 3. Test Circuit and Typical Waveforms for Common Mode Transient Immunity
VCC1
(+5V)
120pF
1.1
kΩ
1
2
DATA
INPUT
3
TTL OR
TOTEM
LSTTL
4
POLE
OUTPUT
GATE
1
FOD2200
VCC 8
7
6
GND 5
2
Figure 4. Recommended LSTTL to LSTTL Circuit
VCC2
(+5V)
DATA
OUTPUT
UP TO 16
LSTTL
LOADS
OR 4 TTL
LOADS
VCC1
(+5V)
120pF (OPTIONAL*)
FOD2200
1.1
kΩ
1
VCC 8
DATA
INPUT
TOTEM
POLE
OUTPUT
GATE
TTL OR
LSTTL
1
2
7
3
6
GND
4
5
VCC2
5V
10V
15V
20V
RL
1.1kΩ
2.37kΩ
3.83kΩ
5.11kΩ
VCC2
(4.5V TO 20V)
RL
CMOS
DATA
OUTPUT
2
Figure 5. LSTTL to CMOS Interface Circuit
VCC1 (+5 V)
DATA
INPUT
TTL OR
LSTTL
FOD2200
1.1kΩ
1
VCC 8
2
D1
3
4
7
6
GND 5
D1 (1N4150) REQUIRED FOR
ACTIVE PULL-UP DRIVER.
Figure 6. Recommended LED Drive Circuit
VCC (+5 V)
120pF (OPTIONAL*)
1.1
FOD2200
kΩ
1
VCC 8
2
4.7k Ω
DATA
INPUT
TTL OR
3
OPEN LSTTL
4
COLLECTOR
GATE
7
6
GND 5
Figure 7. Series LED Drive with Open Collector Gate
(4.7kΩ Resistor Shunts IOH from the LED)
*The 120pF capacitor may be omitted in applications where 500ns propagation delay is sufficient.
©2004 Fairchild Semiconductor Corporation
FOD2200 Rev. 1.0.1
6
www.fairchildsemi.com