Table 1. Maximum Ratings
Rating
Drain - Source Voltage
Gate - Source Voltage
Storage Temperature Range
Operating Junction Temperature
Input Power
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Symbol
VDSS
VGS
Tstg
TJ
Pin
Symbol
RθJC
Value
- 0.5, +65
- 0.5, +12
- 65 to +150
150
12
Value (1)
Unit
Vdc
Vdc
°C
°C
dBm
Unit
°C/W
Final Application
Stage 1, 28 Vdc, IDQ1 = 120 mA
9.2
(Pout = 10 W CW)
Stage 2, 28 Vdc, IDQ2 = 90 mA
3.3
Driver Application
Stage 1, 28 Vdc, IDQ1 = 120 mA
10
(Pout = 2.25 W CW)
Stage 2, 28 Vdc, IDQ2 = 90 mA
3.5
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22 - A114)
0 (Minimum)
Machine Model (per EIA/JESD22 - A115)
A (Minimum)
Charge Device Model (per JESD22 - C101)
III (Minimum)
Table 4. Moisture Sensitivity Level
Test Methodology
Rating
Package Peak Temperature
Unit
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
3
260
°C
Table 5. Electrical Characteristics (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
Functional Tests (In Freescale Wideband 1930 - 1990 MHz Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 120 mA, IDQ2 = 90 mA,
Pout = 5 W Avg., f1 = 1990 MHz, f2 = 1990.1 MHz, Two - Tone Test
Power Gain
Gps
26.5
29
—
dB
Power Added Efficiency
PAE
25
29
—
%
Intermodulation Distortion
IMD
—
- 34
- 27
dBc
Input Return Loss
IRL
—
- 10
dB
Typical Two - Tone Performances (In Freescale Test Fixture, 50 οhm system) VDD = 28 Vdc, IDQ1 = 120 mA, IDQ2 = 90 mA, Pout =
5 W Avg., 1805 - 1880 MHz
Power Gain
Gps
—
29
—
dB
Power Added Efficiency
PAE
—
29
—
%
Intermodulation Distortion
IMD
—
- 34
—
dBc
Input Return Loss
IRL
—
- 15
—
dB
Typical GSM EDGE Performances (In Freescale GSM EDGE Test Fixture, 50 οhm system) VDD = 28 Vdc, IDQ1 = 105 mA, IDQ2 = 95 mA,
Pout = 3.2 W Avg., 1805 - 1880 MHz or 1930 - 1990 MHz EDGE Modulation
Power Gain
Gps
—
29
—
dB
Error Vector Magnitude
EVM
—
1.1
—
% rms
Spectral Regrowth at 400 kHz Offset
SR1
—
- 67
—
dBc
Spectral Regrowth at 600 kHz Offset
SR2
—
- 76
—
dBc
1. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes - AN1955.
MHV5IC1810NR2
2
RF Device Data
Freescale Semiconductor