C8051F97X View Datasheet(PDF) - Silicon Laboratories

Part Name

Description

Manufacturer

C8051F97X

Low Power Capacitive Sensing MCU with up to 32 kB of Flash

Silicon Laboratories 

1. Electrical Characteristics

Throughout the Electrical Characteristics chapter, “VDD” refers to the Supply Voltage.

1.1. Electrical Characteristics

All electrical parameters in all tables are specified under the conditions listed in Table 1.1, unless stated otherwise.

Table 1.1. Recommended Operating Conditions

Parameter

Symbol

Conditions

Min Typ Max Units

Temperature Range

TA

–40

25

85

°C

Supply Voltage

VDD

1.8

3

3.6

V

*Note: All minimum and maximum specifications are guaranteed and apply across the recommended operating conditions.

Typical values apply at nominal supply voltages and an operating temperature of 25 °C unless otherwise noted.

Table 1.2. Global Electrical Characteristics

–40 to +85 °C, 25 MHz system clock unless otherwise specified.

Parameter

Conditions

Min

Typ

Max units

Supply Voltage (VDD)

RAM Data Retention Voltage1

SYSCLK (System Clock)2

1.8

3.0

3.6

V

—

1.4

—

V

0

—

25

MHz

TSYSH (SYSCLK High Time)

TSYSL (SYSCLK Low Time)

Specified Operating Temperature

Range

18

—

—

ns

18

—

—

ns

–40

—

+85

°C

Notes:

1. Based on device characterization data; Not production tested.

2. SYSCLK must be at least 32 kHz to enable debugging.

3. The values in this table are obtained with the CPU executing an “sjmp $” loop, which is the compiled form of a while(1)

loop in C. See the power measurement code examples for more information.

4. Includes oscillator and regulator supply current.

Rev 1.1

10

Share Link: