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100329A View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
Manufacturer
100329A Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Absolute Maximum Ratings(Note 4)
Storage Temperature (TSTG)
Maximum Junction Temperature (Tj)
VEE Pin Potential to Ground Pin
VTTL Pin Potential to Ground Pin
ECL Input Voltage (DC)
ECL Output Current
65°C to +150°C
+150°C
7.0V to +0.5V
0.5V to +6.0V
VEE to +0.5V
(DC Output HIGH)
50 mA
TTL Input Voltage (Note 6)
0.5V to +6.0V
TTL Input Current (Note 6)
30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State
3-STATE Output
0.5V to +5.5V
Current Applied to TTL Output
in LOW State (Max)
ESD (Note 5)
twice the rated IOL (mA)
2000V
Recommended Operating
Conditions
Case Temperature (TC)
ECL Supply Voltage (VEE)
TTL Supply Voltage (VTTL)
0°C to +85°C
5.7V to 4.2V
+4.5V to +5.5V
Note 4: The Absolute Maximum Ratingsare those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The Recommended Operating Conditionstable will define the conditions
for actual device operation.
Note 5: ESD testing conforms to MIL-STD-883, Method 3015.
Note 6: Either voltage limit or current limit is sufficient to protect inputs.
TTL-to-ECL DC Electrical Characteristics (Note 7)
VEE = −4.2V to 5.7V, VCC = VCCA = GND, TC = 0°C to +85°C, VTTL = +4.5V to +5.5V
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
Cutoff Voltage
1025
1830
955
1705
870
1620
mV VIN = VIH (Max) or VIL (Min)
mV Loading with 50to 2V
OE or DIR LOW,
2000 1950
mV VIN = VIH (Max) or VIL (Min)
Loading with 50to 2V
VOHC
Output HIGH Voltage
Corner Point HIGH
1035
mV VIN = VIH (Min) or VIL (Max)
Loading with 50to 2V
VOLC
Output LOW Voltage
Corner Point LOW
1610
mV
VIH
VIL
IIH
IIL
VFCD
Input HIGH Voltage
Input LOW Voltage
Input HIGH Current
Breakdown Test
Input LOW Current
Input Clamp
Diode Voltage
2.0
0
700
1.2
5.0
V
Over VTTL, VEE, TC Range
0.8
V
Over VTTL, VEE, TC Range
70
µA
VIN = +2.7V
1.0
mA VIN = +5.5V
µA
VIN = +0.5V
V
IIN = −18 mA
IEE
VEE Supply Current
LE LOW, OE and DIR HIGH
Inputs OPEN
189
94
mA VEE = −4.2V to 4.8V
199
94
VEE = −4.2V to 5.7V
Note 7: The specified limits represent the worst casevalue for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under worst caseconditions.
3
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