SA25C020 View Datasheet(PDF) - Saifun Semiconductors
Part Name
Description
Manufacturer
SA25C020 Datasheet PDF : 31 Pages
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SA25C020 Advanced Information
SAIFUN
10
AC Test Conditions
Table 3. AC Test Conditions
Symbol
Parameter
25 MHz
Min
Typ
FSCK
SCK Clock Frequency
D.C.
tCRT
Clock Rise Time (Slew Rate)
0.1
tCFT
Clock Fall Time (Slew Rate)
0.1
tWH
SCK High Time
18
tWL
SCK Low Time
18
tCS
CSb High Time
100
tCSS **
CSb Setup Time
10
tCSH **
CSb HOLD Time
10
tHD **
HOLDb Setup Time
10
tCD **
HOLDb Hold Time
10
tV
Output Valid
0
tHO
Output Hold Time
0
tHD:DAT
Data in Hold Time
5
tSU:DAT
Data in Setup Time
5
tLZ **
HOLDb to Output Low Z
tHZ **
HOLDb to Output High Z
tDIS**
Output Disable Time
tWPS**
Write Protect Setup Time
20
tWPH**
Write Protect Hold Time
100
tPW*
Byte or Page Write
10
tRES
Release SP Mode
Endurance
100K
* 256 bytes in the checkerboard programming formation.
** Value guaranteed by characterization, not 100% tested in production
Max
25
15
15
20
15
15
1000
Unit
MHz
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
ns
Erase cycles
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