74LVC1G53 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
Manufacturer
74LVC1G53 Datasheet PDF : 23 Pages
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NXP Semiconductors
74LVC1G53
2-channel analog multiplexer/demultiplexer
10.1 Test circuits
VIL or VIH
VIH
VI
VCC
S
Y0 1
switch
Z
Y1 2
IS
E
GND
VI = VCC or GND; VO = GND or VCC.
Fig 7. Test circuit for measuring OFF-state leakage current
switch S
E
1
VIL VIH
2
VIH VIH
VO
001aad390
VIL or VIH
VIL
IS
VI
VCC
S
Z
E
Y0 1
Y1 2
switch
GND
switch S
E
1
VIL VIL
2
VIH VIL
VO
VI = VCC or GND and VO = open circuit.
Fig 8. Test circuit for measuring ON-state leakage current
001aad391
10.2 ON resistance
Table 8. ON resistance
At recommended operating conditions; voltages are referenced to GND (ground 0 V); for graphs see Figure 10 to Figure 15.
Symbol Parameter
Conditions
−40 °C to +85 °C −40 °C to +125 °C Unit
Min Typ[1] Max Min
Max
RON(peak)
ON resistance (peak)
VI = GND to VCC; see Figure 9
ISW = 4 mA;
VCC = 1.65 V to 1.95 V
ISW = 8 mA; VCC = 2.3 V to 2.7 V
ISW = 12 mA; VCC = 2.7 V
ISW = 24 mA; VCC = 3 V to 3.6 V
ISW = 32 mA; VCC = 4.5 V to 5.5 V
- 34.0 130
-
- 12.0 30
-
- 10.4 25
-
- 7.8 20
-
- 6.2 15
-
195 Ω
45 Ω
38 Ω
30 Ω
23 Ω
74LVC1G53_5
Product data sheet
Rev. 05 — 11 June 2008
© NXP B.V. 2008. All rights reserved.
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