93AA76C-E View Datasheet(PDF) - Microchip Technology

Part Name

Description

Manufacturer

93AA76C-E

8K Microwire Compatible Serial EEPROM

Microchip Technology 

93AA76A/B/C, 93LC76A/B/C, 93C76A/B/C

TABLE 1-2: AC CHARACTERISTICS

All parameters apply over the specified

ranges unless otherwise noted.

VCC = 1.8V to 5.5V

Industrial (I): TA = -40°C to +85°C

Automotive (E): TA = -40°C to +125°C

Param.

No.

Symbol

Parameter

Min

Max Units

Conditions

A1

FCLK

Clock frequency

—

3

MHz 4.5V ≤ VCC < 5.5V

2

MHz 2.5V ≤ VCC < 4.5V

1

MHz 1.8V ≤ VCC < 2.5V

A2

TCKH

Clock high time

200

—

ns 4.5V ≤ VCC < 5.5V

250

ns 2.5V ≤ VCC < 4.5V

450

ns 1.8V ≤ VCC < 2.5V

A3

TCKL

Clock low time

100

—

ns 4.5V ≤ VCC < 5.5V

200

ns 2.5V ≤ VCC < 4.5V

450

ns 1.8V ≤ VCC < 2.5V

A4

TCSS

Chip Select setup time

50

—

ns 4.5V ≤ VCC < 5.5V

100

ns 2.5V ≤ VCC < 4.5V

250

ns 1.8V ≤ VCC < 2.5V

A5

TCSH Chip Select hold time

0

—

ns 1.8V ≤ VCC < 5.5V

A6

TCSL

Chip Select low time

250

—

ns 1.8V ≤ VCC < 5.5V

A7

TDIS

Data input setup time

50

—

ns 4.5V ≤ VCC < 5.5V

100

ns 2.5V ≤ VCC < 4.5V

250

ns 1.8V ≤ VCC < 2.5V

A8

TDIH

Data input hold time

50

—

ns 4.5V ≤ VCC < 5.5V

100

ns 2.5V ≤ VCC < 4.5V

250

ns 1.8V ≤ VCC < 2.5V

A9

TPD

Data output delay time

—

100

ns 4.5V ≤ VCC < 5.5V, CL = 100 pF

250

ns 2.5V ≤ VCC < 4.5V, CL = 100 pF

400

ns 1.8V ≤ VCC < 2.5V, CL = 100 pF

A10 TCZ

Data output disable time

—

100

ns 4.5V ≤ VCC < 5.5V, (Note 1)

200

ns 1.8V ≤ VCC < 4.5V, (Note 1)

A11 TSV

Status valid time

—

200

ns 4.5V ≤ VCC < 5.5V, CL = 100 pF

300

ns 2.5V ≤ VCC < 4.5V, CL = 100 pF

500

ns 1.8V ≤ VCC < 2.5V, CL = 100 pF

A12 TWC

Program cycle time

—

5

ms Erase/Write mode (AA and LC

versions)

A13 TWC

—

2

ms Erase/Write mode

(93C versions)

A14 TEC

—

6

ms ERAL mode, 4.5V ≤ VCC ≤ 5.5V

A15 TWL

—

15

ms WRAL mode, 4.5V ≤ VCC ≤ 5.5V

A16 —

Endurance

1M

— cycles 25°C, VCC = 5.0V, (Note 2)

Note 1: This parameter is periodically sampled and not 100% tested.

2: This application is not tested but ensured by characterization. For endurance estimates in a specific

application, please consult the Total Endurance™ Model which may be obtained from

www.microchip.com.

 2004 Microchip Technology Inc.

DS21796D-page 3

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