A25L05P View Datasheet(PDF) - AMIC Technology

Part Name

Description

Manufacturer

A25L05P

2Mbit / 1Mbit / 512Kbit, Low Voltage, Serial Flash Memory With 85MHz SPI Bus Interface

AMIC Technology 

Absolute Maximum Ratings*

Storage Temperature (TSTG) . . . . . . . . . . -65°C to + 150°C

Lead Temperature during Soldering (Note 1)

D.C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.6V to VCC+0.6V

Transient Voltage (<20ns) on Any Pin to Ground Potential . .

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -2.0V to VCC+2.0V

Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . -0.6V to +4.0V

Electrostatic Discharge Voltage (Human Body model)

(VESD) (Note 2) . . . . . . . . . . . . . . . . . . . -2000V to 2000V

Notes:

1. Compliant with JEDEC Std J-STD-020B (for small body,

Sn-Pb or Pb assembly).

2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω ,

R2=500Ω)

A25L20P/A25L10P/A25L05P Series

*Comments

Stressing the device above the rating listed in the Absolute

Maximum Ratings" table may cause permanent damage to

the device. These are stress ratings only and operation of

the device at these or any other conditions above those

indicated in the Operating sections of this specification is not

implied. Exposure to Absolute Maximum Rating conditions

for extended periods may affect device reliability. Refer also

to the AMIC SURE Program and other relevant quality docu-

ments.

DC AND AC PARAMETERS

This section summarizes the operating and measurement

conditions, and the DC and AC characteristics of the device.

The parameters in the DC and AC Characteristic tables that

follow are derived from tests performed under the

Measurement Conditions summarized in the relevant tables.

Designers should check that the operating conditions in their

circuit match the measurement conditions when relying on

the quoted parameters.

Table 10. Operating Conditions

Symbol

Parameter

VCC

Supply Voltage

TA

Ambient Operating Temperature

Min.

Max.

Unit

2.7

3.6

V

–40

85

°C

Table 11. Data Retention and Endurance

Parameter

Condition

Min.

Erase/Program Cycles At 85°C

Data Retention

At 85°C

Note: 1. This is preliminary data

Table 12. Capacitance

Symbol

Parameter

Test Condition

COUT

Output Capacitance (DO)

VOUT = 0V

CIN

Input Capacitance (other pins)

VIN = 0V

Note: Sampled only, not 100% tested, at TA=25°C and a frequency of 33 MHz.

Max.

100,000

20

Unit

Cycles per sector

Years

Min.

Max.

Unit

8

pF

6

pF

(August, 2007, Version 1.0)

29

AMIC Technology Corp.

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