AD5241(RevB) View Datasheet(PDF) - Analog Devices
Part Name
Description
Manufacturer
AD5241 Datasheet PDF : 16 Pages
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Test Circuits
Test Circuits 1 to 9 define the test conditions used in the product
specifications table.
DUT
A
V؉
W
B
V+ = VDD
1LSB = V+/2N
VMS
Test Circuit 1. Potentiometer Divider Nonlinearity Error
(INL, DNL)
NO CONNECT
DUT
A
W
B
IW
VMS
Test Circuit 2. Resistor Position Nonlinearity Error (Rheo-
stat Operation; R-INL, R-DNL)
VMS2
DUT
A
W
B
IW = VDD /RNOMINAL
VW
VMS1 RW = [VMS1 – VMS2]/IW
Test Circuit 3. Wiper Resistance
VA
VDD A
V+
W
B
( ) V+ = VDD 10%
PSRR (dB) = 20 LOG
⌬VMS
⌬VDD
PSS (%/%) = ⌬VMS%
⌬VDD%
VMS
Test Circuit 4. Power Supply Sensitivity (PSS, PSRR)
OFFSET
GND
A DUT B
5V
W
OP279
OFFSET
BIAS
VOUT
Test Circuit 5. Inverting Gain
AD5241/AD5242
5V
OFFSET
GND
OP279
VIN
W
A DUT B
OFFSET
BIAS
VOUT
Test Circuit 6. Noninverting Gain
A
W
VIN
DUT
OFFSET
GND
B
2.5V
+15V
OP42
–15V
VOUT
Test Circuit 7. Gain vs. Frequency
DUT
W
B
RSW =
0.1V
ISW
CODE = H
ISW
0.1V
VSS TO VDD
Test Circuit 8. Incremental ON Resistance
NC
VDD
DUT
A
ICM
W
VSS GND
B
NC
VCM
Test Circuit 9. Common-Mode Leakage Current
REV. B
–13–
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