AD7538 View Datasheet(PDF) - Analog Devices

Part Name

Description

Manufacturer

AD7538

LC2MOS Microprocessor-Compatible 14-Bit DAC

Analog Devices 

AD7538

TERMINOLOGY

Relative Accuracy

Relative accuracy or endpoint nonlinearity is a measure of the

maximum deviation from a straight line passing through the

endpoints of the DAC transfer function. It is measured after

adjusting for zero error and full-scale error and is normally

expressed in least significant bits or as a percentage of full-

scale reading.

Differential Nonlinearity

Differential nonlinearity is the difference between the measured

change and the ideal 1 LSB change between any two adjacent

codes. A specified differential nonlinearity of ±1 LSB maximum

over the operating temperature range ensures monotonicity.

Gain Error

Gain error is a measure of the output error between an ideal

DAC and the actual device output. It is measured with all 1s

in the DAC after the offset error has been adjusted out and is

expressed in least significant bits. Gain error is adjustable to

zero with an external potentiometer.

Digital-To-Analog Glitch Impulse

The amount of charge injected from the digital inputs to the

analog output when the inputs change state is called digital-to-

analog glitch impulse. This is normally specified as the area of

the glitch in either pA-secs or nV-secs depending upon whether

the glitch is measured as a current or voltage. It is measured

with VREF = AGND.

Output Capacitance

This is the capacitance from IOUT to AGND.

Output Leakage Current

Output leakage current is current which appears at IOUT with the

DAC register loaded to all 0s.

Multiplying Feedthrough Error

This is the ac error due to capacitive feedthrough from the VREF

terminal to IOUT with the DAC register loaded to all zeros.

Rev. B | Page 8 of 16

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