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ADN2860(RevB) View Datasheet(PDF) - Analog Devices

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Description
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ADN2860 Datasheet PDF : 20 Pages
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ADN2860
ELECTRICAL CHARACTERISTICS
Single Supply: VDD = 3 V to 5.5 V and −40°C < TA < +85°C, unless otherwise noted.
Dual Supply: VDD = +2.25 V or +2.75 V, VSS = −2.25 V or −2.75 V, and −40°C < TA < +85°C, unless otherwise noted.
Table 2.
Parameter
Symbol
Conditions
Min Typ1
DYNAMIC CHARACTERISTICS 2, 3
Bandwidth −3 dB
BW
VDD/VSS = ±2.5 V, RAB = 25 kΩ/250 kΩ.
125/12
Total Harmonic Distortion
THDW
VA = 1 V rms, VB = 0 V, f = 1 kHz.
0.05
VW Settling Time
tS
VA = VDD, VB = 0 V,
4/36
VW = 0.50% error band,
code = 0x000 to 0x100, RAB = 25 kΩ/250 kΩ.
Resistor Noise Spectral Density
eN_WB
RAB = 25 kΩ/250 kΩ, TA = 25°C.
14/45
Digital Crosstalk
CT
VA = VDD, VB = 0 V, measure VW with
−80
adjacent RDAC making full-scale
change.
Analog Crosstalk
CAT
Signal input at A0 and measure output
−72
at W1, f = 1 kHz.
INTERFACE TIMING CHARACTERISTICS (Apply
to All Parts)4, 5
SCL Clock Frequency
fSCL
tBUF Bus Free Time between Stop and Start t1
1.3
tHD;STA Hold Time (Repeated Start)
t2
After this period, the first clock pulse is 600
generated.
tLOW Low Period of SCL Clock
t3
1.3
tHIGH High Period of SCL Clock
t4
0.6
tSU;STA Setup Time for Start Condition
t5
600
tHD;DAT Data Hold Time
t6
tSU;DAT Data Setup Time
t7
100
tR Rise Time of Both SDA and SCL Signals
t8
tF Fall Time of Both SDA and SCL Signals
t9
tSU;STO Setup Time for Stop Condition
t10
600
EEMEM Data Storing Time
tEEMEM_STORE
26
EEMEM Data Restoring Time at Power-On
tEEMEM_RESTORE1
360
EEMEM Data Restoring Time on Restore
tEEMEM_RESTORE2
360
Command or Reset Operation
EEMEM Data Rewritable Time
tEEMEM_REWRITE
540
FLASH/EE MEMORY RELIABILITY
Endurance6
100
Data Retention7
55°C.
100
Max
400
50
900
300
300
Unit
kHz
%
μs
nV√Hz
dB
dB
kHz
μs
ns
μs
μs
ns
ns
ns
ns
ns
ns
ms
μs
μs
μs
kcycles
years
1 Typical represents average readings at 25°C, VDD = 5 V.
2 All dynamic characteristics use VDD = 5 V.
3 Guaranteed by design and not subject to production test.
4 Bandwidth, noise, and settling time are dependent on the terminal resistance value chosen. The lowest R value results in the fastest settling time and highest
bandwidth. The highest R value results in the minimum overall power consumption.
5 See Figure 2 for the location of measured values.
6 Endurance is qualified to 100,000 cycles as per JEDEC Std. 22 Method A117 and measured at −40°C, +25°C, and +85°C. Typical endurance at 25°C is 700,000 cycles.
7 Retention lifetime equivalent at junction temperature (TJ) = 55°C as per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6 eV
derates with junction temperature.
Rev. B | Page 5 of 20

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