DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

ADUM1233BRWZ View Datasheet(PDF) - Analog Devices

Part Name
Description
Manufacturer
ADUM1233BRWZ Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ADuM1233
APPLICATION NOTES
COMMON-MODE TRANSIENT IMMUNITY
In general, common-mode transients consist of linear and
sinusoidal components. The linear component of a common-
mode transient is given by
VCM, linear = (ΔV/Δt) t
where ΔV/Δt is the slope of the transient shown in Figure 11
and Figure 12.
The transient of the linear component is given by
dVCM/dt = ΔV/Δt
The ability of the ADuM1233 to operate correctly in the
presence of linear transients is characterized by the data in
Figure 8. The data is based on design simulation and is the
maximum linear transient magnitude that the ADuM1233 can
tolerate without an operational error. This data shows a higher
level of robustness than what is listed in Table 5 because the
transient immunity values obtained in Table 5 use measured
data and apply allowances for measurement error and margin.
400
350
300
BEST-CASE PROCESS VARIATION
250
200
150
WORST-CASE PROCESS VARIATION
100
50
0
–40
–20
0
20
40
60
TEMPERATURE (°C)
80
100
Figure 8. Transient Immunity (Linear Transients) vs. Temperature
The sinusoidal component (at a given frequency) is given by
VCM, sinusoidal = V0sin(2πft)
where:
V0 is the magnitude of the sinusoidal.
f is the frequency of the sinusoidal.
The transient magnitude of the sinusoidal component is given by
dVCM/dt = 2πf V0.
The ability of the ADuM1233 to operate correctly in the
presence of sinusoidal transients is characterized by the data in
Figure 9 and Figure 10. The data is based on design simulation
and is the maximum sinusoidal transient magnitude (2πf V0)
that the ADuM1233 can tolerate without an operational error.
Values for immunity against sinusoidal transients are not
included in Table 5 because measurements to obtain such values
have not been possible.
300
250
BEST-CASE PROCESS VARIATION
200
150
100
50
WORST-CASE PROCESS VARIATION
0
0
250 500 750 1,000 1,250 1,500 1,750 2,000
FREQUENCY (MHz)
Figure 9. Transient Immunity (Sinusoidal Transients),
27°C Ambient Temperature
250
200
BEST-CASE PROCESS VARIATION
150
100
50
WORST-CASE PROCESS VARIATION
0
0
250 500 750 1,000 1,250 1,500 1,750 2,000
FREQUENCY (MHz)
Figure 10. Transient Immunity (Sinusoidal Transients),
100°C Ambient Temperature
Rev. A | Page 8 of 12

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]