AM29LV200BB-70RDFC View Datasheet(PDF) - Advanced Micro Devices

Part Name

Description

Manufacturer

AM29LV200BB-70RDFC

2 Megabit (256 K x 8-Bit/128 K x 16-Bit) CMOS 3.0 Volt-only, Boot Sector Flash Memory, Die Revison 1

Advanced Micro Devices 

SUPPLEMENT

PRODUCT TEST FLOW

Figure 1 provides an overview of AMD’s Known Good

Die test flow. For more detailed information, refer to the

Am29LV200B product qualification database. AMD

implements quality assurance procedures throughout

the product test flow. These QA procedures also allow

AMD to produce KGD products without requiring or

implementing burn-in. In addition, an off-line qualifica-

tion maintenance program (QMP) further guarantees

AMD quality standards are met on Known Good Die

products.

Wafer Sort 1

Bake

24 hours at 250°C

DC Parameters

Functionality

Programmability

Erasability

Data Retention

Wafer Sort 2

DC Parameters

Functionality

Programmability

Erasability

Wafer Sort 3

High Temperature

DC Parameters

Functionality

Programmability

Erasability

Speed

Packaging for Shipment

Incoming Inspection

Wafer Saw

Die Separation

100% Visual Inspection

Die Pack

Shipment

Figure 1. AMD KGD Product Test Flow

8

Am29LV200B Known Good Die

November 18, 2003

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