ATF-33143-BLKG View Datasheet(PDF) - Avago Technologies
Part Name
Description
Manufacturer
ATF-33143-BLKG Datasheet PDF : 17 Pages
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ATF-33143 Absolute Maximum Ratings[1]
Symbol
VDS
VGS
VGD
IDS
Pdiss
Pin max
TCH
TSTG
jc
Parameter
Drain - Source Voltage[2]
Gate - Source Voltage[2]
Gate Drain Voltage[2]
Drain Current[2]
Total Power Dissipation[4]
RF Input Power
Channel Temperature[5]
Storage Temperature
Thermal Resistance[6]
Units
V
V
V
mA
mW
dBm
°C
°C
°C/W
Absolute
Maximum
5.5
-5
-5
Idss[3]
600
20
160
-65 to 160
145
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Assumes DC quiesent conditions.
3. VGS = 0 V
4. Source lead temperature is 25°C. Derate
6 mW/°C for TL > 60°C.
5. Please refer to failure rates in reliability
section to assess the reliability impact
of running devices above a channel
temperature of 140°C.
6. Thermal resistance measured using 150°C
Liquid Crystal Measurement method.
Product Consistency Distribution Charts [8, 9]
500
+0.6 V
400
300
0V
200
100
–0.6 V
0
0
2
4
6
8
V DS (V)
Figure 1. Typical Pulsed I-V Curves[7]. (VGS=-0.2V per step)
120
Cpk = 1.7
Std = 0.05
100
80
-3 Std
60
+3 Std
40
20
0
0.2 0.3 0.4 0.5 0.6 0.7 0.8
NF (dB)
Figure 2. NF @ 2 GHz, 4 V, 80 mA.
LSL=0.2, Nominal=0.53, USL=0.8
100
Cpk = 1.21
120
Std = 0.94
80
100
Cpk = 2.3
Std = 0.2
60
-3 Std
40
20
+3 Std
80
-3 Std
+3 Std
60
40
20
0
29
31
33
35
37
OIP3 (dBm)
Figure 3. OIP3 @ 2 GHz, 4 V, 80 mA.
LSL=30.0, Nominal=33.3, USL=37.0
0
13
14
15
16
17
GAIN (dB)
Figure 4. Gain @ 2 GHz, 4 V, 80 mA.
LSL=13.5, Nominal=14.8, USL=16.5
Notes:
7. Under large signal conditions, VGS may swing positive and the drain current may exceed Idss. These conditions are acceptable as long as the maximum
Pdiss and Pin max ratings are not exceeded.
8. Distribution data sample size is 450 samples taken from 9 different wafers. Future wafers allocated to this product may have nominal values
anywhere within the upper and lower spec limits.
9. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based
on production test requirements. Circuit losses have been de-embedded from actual measurements.
10. The probability of a parameter being between ±1 is 68.3%, between ±2σ is 95.4% and between ±3σ is 99.7%.
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