ATF-34143 View Datasheet(PDF) - Avago Technologies
Part Name
Description
Manufacturer
ATF-34143 Datasheet PDF : 14 Pages
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ATF-34143 Absolute Maximum Ratings[1]
Symbol
VDS
VGS
VGD
ID
Pdiss
Pin max
TCH
TSTG
jc
Parameter
Drain - Source Voltage[2]
Gate - Source Voltage[2]
Gate Drain Voltage[2]
Drain Current[2]
Total Power Dissipation[4]
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance[5]
Units
V
V
V
mA
mW
dBm
°C
°C
°C/W
Absolute
Maximum
5.5
-5
-5
Idss [3]
725
17
160
-65 to 160
165
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Assumes DC quiescent conditions.
3. VGS = 0 volts.
4. Source lead temperature is 25°C. Derate
6 mW/°C for TL > 40°C.
5. Thermal resistance measured using 150°C
Liquid Crystal Measurement method.
6. Under large signal conditions, VGS may
swing positive and the drain current may
exceed Idss. These conditions are acceptable
as long as the maximum Pdiss and Pin max
ratings are not exceeded.
Product Consistency Distribution Charts [7]
250
+0.6 V
200
150
0V
100
50
–0.6 V
0
0
2
4
6
VDS (V)
Figure 1. Typical/Pulsed I-V Curves[6].
(VGS=-0.2V per step)
120
100
80
-3 Std
+3 Std
60
8
Cpk = 2.69167
Std = 0.04
9 Wafers
Sample Size = 450
120
100
80
-3 Std
60
+3 Std
Cpk = 1.37245
Std = 0.66
9 Wafers
Sample Size = 450
40
20
0
29 30
31 32 33
OIP3 (dBm)
34 35
Figure 2. OIP3 @ 2 GHz, 4†V, 60 mA.
LSL=29.0, Nominal=31.8, USL=35.0
120
100
80
-3 Std
+3 Std
60
Cpk = 2.99973
Std = 0.15
9 Wafers
Sample Size = 450
40
40
20
20
0
0
0.2
0.4
0.6
0.8
NF (dB)
0
16 16.5
17 17.5 18
GAIN (dB)
18.5 19
Figure 3. NF @ 2 GHz, 4†V, 60 mA.
Figure 4. Gain @ 2 GHz, 4†V, 60 mA.
LSL=0.1, Nominal=0.47, USL=0.8
LSL=16.0, Nominal=17.5, USL=19.0
Notes:
7. Distribution data sample size is 450 samples taken from 9 different wafers. Future wafers allocated to this product may have nominal values
anywhere within the upper and lower spec limits.
8. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based
on production test requirements. Circuit losses have been de-embedded from actual measurements.
2
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