ATF22LV10CQZ-30JU View Datasheet(PDF) - Atmel Corporation

Part Name

Description

Manufacturer

ATF22LV10CQZ-30JU

High-performance Electrically Erasable Programmable Logic Device

Atmel Corporation 

4.1 DC Characteristics

Symbol Parameter

Condition(2)

Min

Typ

Max

IIL

Input or I/O Low

Leakage Current

0  VIN  VIL (Max)

-10.0

IIH

Input or I/O High

Leakage Current

(VCC - 0.2)V  VIN  VCC

10.0

ICC

Clocked Power

Supply Current

VCC = Max

Outputs Open,

f = 15MHz

CZ-25(3)

CZ-25(3)

CQZ-30

CQZ-30

Com.

Ind.

Com.

Ind.

50.0

85.0

55.0

90.0

18.0

50.0

19.0

60.0

CZ-25(3) Com.

ISB

Power Supply Current,

Standby

VCC = Max

VIN = Max

Outputs Open

CZ-25(3)

CQZ-30

Ind.

Com.

CQZ-30 Ind.

3.0

25.0

4.0

50.0

3.0

25.0

4.0

50.0

IOS(1)

Output Short Circuit

Current

VOUT = 0.5V

-130.0

VIL

VIH

VOL

VOH

VOH

Note:

Input Low Voltage

-0.5

0.8

Input High Voltage

2.0

VCC + 0.75

VIN = VIH or VIL

Output Low Voltage

VCC = Min,

0.5

IOL = 16mA

VIN = VIH or VIL

Output High Voltage

VCCIO = Min,

2.4

IOH = -2.0mA

Output High Voltage

IOH = -100 µA

VCC - 0.2V

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec

2. For DC characterization, the test condition of VCC = Max corresponds to 3.6V

3. Shaded devices are becoming obsolete and replaced with CQZ-30 part in green package offering

Units

µA

µA

mA

mA

mA

mA

µA

µA

µA

µA

mA

V

V

V

V

V

4 Atmel ATF22LV10C(Q)Z

0779M–PLD–7/10

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