28LV010RT1DE20 View Datasheet(PDF) - MAXWELL TECHNOLOGIES
Part Name
Description
Manufacturer
28LV010RT1DE20 Datasheet PDF : 20 Pages
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3.3V 1 Megabit (128K x 8-Bit) EEPROM
28LV010
TABLE 7. 28LV010 AC CHARACTERISTICS FOR READ OPERATION1
(VCC = 3.3V ± 10%, TA = -55 TO +125 °C UNLESS OTHERWISE SPECIFIED)
PARAMETER
TEST CONDITIONS
SYMBOL
SUBGROUPS
MIN
MAX
UNIT
Address Access Time
-200
-250
CE = OE = VIL, WE = VIH
tACC
9, 10, 11
ns
--
200
--
250
Chip Enable Access Time
-200
-250
OE = VIL, WE = VIH
tCE
9, 10, 11
ns
--
200
--
250
Output Enable Access Time
-200
-250
CE = VIL, WE = VIH
tOE
9, 10, 11
ns
0
110
0
120
Output Hold to Address Change
tOH
9, 10, 11
ns
-200
CE = OE = VIL, WE = VIH
0
--
-250
0
--
Output Disable to High-Z2
-200
-250
CE = VIL, WE = VIH
tDF
9, 10, 11
ns
0
50
0
50
Output Disable to High-Z
-200
-250
RES to Output Delay 3
-200
-250
tDFR
CE =OE= VIL, WE = VIH
tRR
CE = OE = VIL WE = VIH
9, 10, 11
0
0
9, 10, 11
0
0
ns
300
350
ns
525
600
1. Test conditions: Input pulse levels - 0.4V to 2.4V; input rise and fall times < 20 ns; output load - 1 TTL gate + 100 pF (including
scope and jig); reference levels for measuring timing - 0.8V/1.8V.
2. tDF and tDFR is defined as the time at which the output becomes an open circuit and data is no longer driven.
3. Guaranteed by design.
03.14.03 REV 6
All data sheets are subject to change without notice 4
©2001 Maxwell Technologies
All rights reserved.
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