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28LV010RT2DB25 View Datasheet(PDF) - MAXWELL TECHNOLOGIES

Part Name
Description
Manufacturer
28LV010RT2DB25
Maxwell
MAXWELL TECHNOLOGIES Maxwell
28LV010RT2DB25 Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
3.3V 1 Megabit (128K x 8-Bit) EEPROM
28LV010
TABLE 8. 28LV010 AC ELECTRICAL CHARACTERISTICS FOR ERASE AND WRITE OPERATIONS
(VCC = 3.3V ± 10%, TA = -55 TO +125 °C UNLESS OTHERWISE SPECIFIED)
PARAMETER
SYMBOL
SUBGROUPS
MIN
MAX
UNIT
Byte Load Cycle
-200
-250
Data Latch Time2
-200
-250
Byte Load Window 2
-200
-250
tBLC
9, 10, 11
1
1
µs
30
30
tDL
9, 10, 11
ns
700
-
750
-
tBL
9, 10, 11
µs
100
--
100
--
Time to Device Busy
-200
-250
tDB
9, 10, 11
ns
100
--
120
--
Write Start Time
-200
-250
RES to Write Setup Time2
-200
-250
VCC to RES Setup Time 2
-200
-250
tDW
9, 10, 11
ns
150
--
250
--
tRP
9, 10, 11
µs
100
--
100
--
tRES
9, 10, 11
1
1
µs
--
--
1. tWC must be longer than this value unless polling techniques or RDY/BSY are used. This device automatically completes the
internal write operation within this value.
2. Guaranteed by design.
TABLE 9. 28LV010 MODE SELECTION1,2
MODE
CE
OE
WE
RES
RDY/BUSY
Read
Standby
Write
Deselect
Write Inhibit
Data Polling
Program
VIL
VIL
VIH
VH
High-Z
VIH
X
X
X
High-Z
VIL
VIH
VIL
VH
High-Z --> VOL
VIL
VIH
VIH
VH
High-Z
X
X
VIH
X
--
X
VIL
X
X
--
VIL
VIL
VIH
VH
VOL
X
X
X
VIL
High-Z
1. X = Don’t care.
2. Refer to the recommended DC operating conditions.
I/O
DOUT
High-Z
DIN
High-Z
--
--
Data Out (I/O7)
High-Z
03.14.03 REV 6
All data sheets are subject to change without notice 6
©2001 Maxwell Technologies
All rights reserved.

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