HI2570, CXD2570
Electrical Specifications (Continued)
PARAMETER
SYMBOL
TEST
CONDITIONS
PART NUMBER
OR GRADE
MIN
TYP
MAX
SOUT Delay Time
tds
CL = 60pF
9
—
65
SOUT Data Recovery Time
tzd
7
—
42
SOUT Data Erase Time
tdz
6
—
40
XTLI Pulse Width for Low Period twl
FS = 16kHz, 256Fs
40
(XSL0 = XSL1 = XSL2 = Low
—
200
NOTES:
3. This includes current consumption at load resistance (RL = 3.9Ω). Fs = 16kHz
*1 All input pins except AIN1 and AIN2, and when bidirectional pins (BCK and LRCK) are input mode.
*2 AIN1, AIN2
*3 XCLK, XMCK2, SOUT
*4 AOUT1 (+), AOUT1 (-), AOUT2 (+), AOUT2 (-), UCLK
*5 XTLO
*6 When bidirectional pins (BCK and LRCK) are output mode
*7 All input pins except AIN1 and AIN2
*8 When directional pins (BCK and LRCK) are input mode
*9 MS, WO, CLR
*10 TEST
*11 SOUT, AOUT1 (+), AOUT1 (-), AOUT2 (+), AOUT2 (-), UCLK
*12 Resistance between XTLO and XTLI
APPLICABLE
UNITS
PINS
ns
ns
ns
ns
Analog Characteristics AVDD1 = AVDD2 = AVDD3 = AVDD4 = XVDD = DVDD = 5.0V ± 10%, AVSS1 = AVSS2 = AVSS3 = AVSS4 =
XVSS = DVSS = 0V, TA = 25oC
ITEM
CONDITIONS
MIN.
TYP.
MAX.
UNIT
ADC + DAC Connection Overall Characteristics. Measured under the following conditions unless otherwise specified.
Input waveform = 1kHz sine wave, 1.4Vrms (= 0dB), RIN = 16kΩ
XTAI = 16.384MHz (= 1024Fs, Fs = 16kHz)
CLR = MS = WO = open (= 5V)
SOUT and SIN directly coupled.
S/N Ratio
8kHz LPF
74
80
—
dB
THD + N
8kHz LPF
—
0.015
0.03
%
Dynamic Range
1kHz, -60dB
8kHz LPF
74
80
—
dB
Channel Separation
1kHz, 0dB
—
97
—
dB
Gain Difference Between Channels
—
0.1
—
dB
Gain
RL = 3.9kW
-3
0
+3
dB
Input Level
DC Offset (ADC Output)
RIN = 0Ω
RIN = 16Ω
—
0.1
—
Vrms
—
1.4
—
Vrms
—
030F
—
Hex
ADC Input Impedance
—
1.2
kΩ
DAC characteristics in a single unit. Measured under the following conditions unless otherwise specified.
Input data = 1kHz sine wave, full scale (= 0dB)
XTAI = 16.384MHz (= 1024Fs, Fs = 16kHz
CLR = WO = open (= 5V), MS = GND
S/N Ratio
8kHz LPF
84
90
—
dB
THD + N
8kHz LPF, -3dB
—
0.009
0.03
%
Dynamic Range
1kHz, -60dB
8kHz LPF
82
88
—
dB
6