CY7C1351 View Datasheet(PDF) - Cypress Semiconductor

Part Name

Description

Manufacturer

CY7C1351

128Kx36 Flow-Through SRAM with NoBL™ Architecture

Cypress Semiconductor 

Capacitance[10]

Parameter

CIN

CCLK

CI/O

Description

Input Capacitance

Clock Input Capacitance

Input/Output Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,

VDD = 3.3V

VDDQ = 3.3V

AC Test Loads and Waveforms

OUTPUT

Z0 =50Ω

3.3V

OUTPUT

RL =50Ω

5 pF

VL = 1.5V

(a)

INCLUDING

JIG AND

SCOPE

R=317Ω

R=351Ω GND

(b)

1351-2

CY7C1351

Max.

4

4

4

Unit

pF

pF

pF

ALL INPUT PULSES

3.0V

1351-3

Thermal Resistance

Description

Test Conditions

Symbol

Thermal Resistance

Still Air, soldered on a 4.25 x 1.125 inch,

ΘJA

(Junction to Ambient) 4-layer printed circuit board

Thermal Resistance

ΘJC

(Junction to Case)

Note:

10. Tested initially and after any design or process change that may affect these parameters.

TQFP Typ.

28

Units

°C/W

Notes

10

4

°C/W

10

8

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