CY7C1352F-100AI View Datasheet(PDF) - Cypress Semiconductor
Part Name
Description
Manufacturer
CY7C1352F-100AI Datasheet PDF : 13 Pages
| |||
CY7C1352F
Electrical Characteristics Over the Operating Range[9, 10] (continued)
Parameter
Description
Test Conditions
ISB1
Automatic CE
VDD = Max, Device Deselected, 4-ns cycle, 250 MHz
Power-Down
VIN ≥ VIH or VIN ≤ VIL
4.4-ns cycle, 225 MHz
Current—TTL Inputs f = fMAX = 1/tCYC
5-ns cycle, 200 MHz
6-ns cycle, 166 MHz
7.5-ns cycle, 133 MHz
10-ns cycle, 100 MHz
ISB2
Automatic CE
VDD = Max, Device Deselected, All speeds
Power-down
VIN ≤ 0.3V or VIN > VDDQ – 0.3V, f
Current—CMOS Inputs = 0
ISB3
Automatic CE
VDD = Max, Device Deselected, or 4-ns cycle, 250 MHz
Power-down
VIN ≤ 0.3V or VIN > VDDQ – 0.3V 4.4-ns cycle, 225 MHz
Current—CMOS Inputs f = fMAX = 1/tCYC
5-ns cycle, 200 MHz
6-ns cycle, 166 MHz
7.5-ns cycle, 133 MHz
10-ns cycle, 100 MHz
ISB4
Automatic CE
VDD = Max, Device Deselected, All speeds
Power-down
VIN ≥ VIH or VIN ≤ VIL, f = 0
Current—TTL Inputs
Shaded areas contain advance information.
Min.
Max. Unit
120
mA
115
mA
110
mA
100
mA
90
mA
80
mA
40
mA
105
mA
100
mA
95
mA
85
mA
75
mA
65
mA
45
mA
Thermal Resistance[11]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
TQFP
Package
41.83
9.99
Unit
°C/W
°C/W
Capacitance[11]
CIN
CCLK
CI/O
Parameter
Description
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VDD = 3.3V,
VDDQ = 3.3V
Max.
5
5
5
Unit
pF
pF
pF
Document #: 38-05211 Rev. *C
Page 8 of 13
Share Link: 