NXP Semiconductors
DAC1627D1G25
Dual 16-bit DAC: up to 1.25 Gsps; x2, x4 and x8 interpolating
2. Features and benefits
Dual 16-bit resolution
Synchronization of multiple DAC
devices
1.25 Gsps maximum update rate
3 or 4 wires mode SPI interface
Selectable ×2, ×4 and ×8 interpolation Differential scalable output current from
filters
6.95 mA to 31.8 mA
Very low noise capacitor-free integrated External analog offset control
Phase-Locked Loop (PLL)
(10-bit auxiliary DACs)
Embedded Numerically Controlled
High resolution internal digital gain and
Oscillator (NCO) with 40-bit
offset control to support high
programmable frequency
performance IQ-modulator image
rejection
Embedded complex modulator
Internal phase correction
1.8 V and 3.3 V power supplies
Inverse (sin x) / x function
LVDS DDR compatible input interface Power-down mode and Sleep mode;
with on-chip 100 Ω terminations
5-bit NCO low power mode
LVDS DDR input clock up to 312.5 MHz On-chip 1.25 V reference
LVDS or LVPECL compatible DAC clock Industrial temperature range −40 °C to
+85 °C
Interleaved or folded I and Q data input 72 pins small form factor HVQFN
mode
package
3. Applications
Wireless infrastructure: MG_GSM, LTE, WiMAX, GSM, CDMA, WCDMA, TD-SCDMA
Communication: LMDS/MMDS, point-to-point
Direct Digital Synthesis (DDS)
Broadband wireless systems
Digital radio links
Instrumentation
Automated Test Equipment (ATE)
4. Ordering information
Table 1. Ordering information
Type number
Package
Name
Description
DAC1627D1G25 HVQFN72 plastic thermal enhanced very thin quad flat package; no leads;
72 terminals; body 10 × 10 × 0.85 mm
Version
SOT813-3
DAC1627D1G25
Objective data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 29 April 2011
© NXP B.V. 2011. All rights reserved.
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