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EBE21EE8ACWA-8E-E View Datasheet(PDF) - Elpida Memory, Inc

Part Name
Description
Manufacturer
EBE21EE8ACWA-8E-E
Elpida
Elpida Memory, Inc Elpida
EBE21EE8ACWA-8E-E Datasheet PDF : 30 Pages
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EBE21EE8ACWA
AC Timing for IDD Test Conditions
For purposes of IDD testing, the following parameters are to be utilized.
DDR2-800
DDR2-800
DDR2-667
Parameter
5-5-5
6-6-6
5-5-5
Unit
CL (IDD)
5
6
5
tCK
tRCD (IDD)
12.5
15
15
ns
tRC (IDD)
57.5
60
60
ns
tRRD (IDD)
7.5
7.5
7.5
ns
tFAW (IDD)
35
35
37.5
ns
tCK (IDD)
2.5
2.5
3
ns
tRAS (min.)(IDD)
45
45
45
ns
tRAS (max.)(IDD)
70000
70000
70000
ns
tRP (IDD)
12.5
15
15
ns
tRFC (IDD)
127.5
127.5
127.5
ns
Data Sheet E1215E10 (Ver. 1.0)
14

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