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LT1331 View Datasheet(PDF) - Linear Technology

Part Name
Description
Manufacturer
LT1331 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
LT1331
ELECTRICAL CHARACTERISTICS
PARAMETER
CONDITIONS
MIN TYP MAX
UNITS
Any Driver
Output Voltage Swing, Positive
Output Voltage Swing, Negative
Logic Input Voltage Level
Logic Input Current
Output Short-Circuit Current
Output Leakage Current
Data Rate (Note 8)
Slew Rate
Propagation Delay
Any Receiver
Input Voltage Thresholds
Hysteresis
Input Resistance
Receivers 1 Through 4
Output Voltage
Output Short-Circuit Current
Propagation Delay
Output Leakage Current
Receiver 5 (Low Q-Current RX)
Output Voltage
Output Short-Circuit Current
Propagation Delay
VCC = 5V, RL = 3k
VCC = 3.3V, RL = 3k
VCC = 5V, RL = 3k
VCC = 3.3V, RL = 3k
Input Low Level (VOUT = High)
Input High Level (VOUT = Low)
0.8V VIN 2V
VOUT = 0V
Shutdown VOUT = ±30V (Note 5)
RL = 3k, CL = 2500pF
RL = 3k, CL = 1000pF
RL = 3k, CL = 51pF
RL = 3k, CL = 2500pF
Output Transition tHL High to Low (Note 6)
Output Transition tLH Low to High
Input Low Threshold (VOUT = High)
Input High Threshold (VOUT = Low)
VIN = ±10V
Output Low, IOUT = – 1.6mA
Output High, IOUT = 160µA (VL = 3.3V)
Sinking Current, VOUT = VCC
Sourcing Current, VOUT = 0V
Output Transition tHL High to Low (Note 7)
Output Transition tLH Low to High
Shutdown (Note 5) 0 VOUT VCC
Output Low, IOUT = – 500µA
Output High, IOUT = 160µA (VL = 3V)
Sinking Current, VOUT = VCC
Sourcing Current, VOUT = 0V
Output Transition tHL High to Low (Note 7)
Output Transition tLH Low to High
q 5.0
6.5
3.7
4.0
q
– 6.0 – 5.0
– 3.3 – 2.7
q
1.4
0.8
q 2.0
1.4
q
5
20
±9
17
q
10
100
120
250
15
30
6
0.6
1.3
0.5
1.3
q 0.8
1.3
q
1.7
2.4
q 0.1
0.4
1.0
3
5
7
q
q 2.0
10
q
0.2
0.4
2.4
– 20 – 10
20
250 600
350 600
1
10
q
0.2
0.4
q 2.0
2.4
–4
–2
2
4
1
3
1
3
V
V
V
V
V
V
µA
mA
µA
kBaud
kBaud
V/ µs
V/ µs
µs
µs
V
V
V
k
V
V
mA
mA
ns
ns
µA
V
V
mA
mA
µs
µs
The q denotes specifications which apply over the full operating
temperature range (0°C TA 70°C for commercial grade).
Note 1: Absolute Maximum Ratings are those values beyond which the life
of a device may be impaired.
Note 2: Testing done at VCC = 5V, VL = 3.3V, and VON/OFF = 3V, unless
otherwise stated.
Note 3: Supply current is measured as the average over several charge
pump cycles. C + = 1µF, C = 0.1µF, C1 = C2 = 0.2µF. All outputs are open
with all driver inputs tied high.
Note 4: VL supply current is measured with all receiver outputs high.
Note 5: Supply current and leakage current measurements in shutdown
are performed with VON/OFF 0.1V. Supply current measurements using
driver disable are performed with VDRIVER DISABLE 3V.
Note 6: For driver delay measurements, RL = 3k and CL = 51pF. Trigger
points are set between the driver’s input logic threshold and the output
transition to the zero crossing (t HL = 1.4V to 0V and tLH = 1.4V to 0V).
Note 7: For receiver delay measurements, CL = 51pF. Trigger points are
set between the receiver’s input logic threshold and the output transition
to standard TTL/CMOS logic threshold (t HL = 1.3V to 2.0V and tLH = 1.7V
to 0.8V).
Note 8: Data rate operation guaranteed by slew rate, short-circuit current
and propagation delay tests.
3

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