FOD8160 View Datasheet(PDF) - Fairchild Semiconductor

Part Name

Description

Manufacturer

FOD8160

High Noise Immunity, 3.3 V / 5 V, 10 Mbit/sec, Logic Gate Optocoupler in Wide-Body SOP 5-Pin

Fairchild Semiconductor 

Test Circuit

Pulse Gen.

IF

5 MHz

tf = tr = 5 ns

DC = 50%

Input

Monitoring

Mode

RM

0.1 μF

Bypass

350 Ω

VO Monitoring

CLNode

Input

(IF = 6 mA)

50%

Output

tf

tPHL

tPLH

tr

90%

1.5 V

10%

VOL

Figure 13. Test Circuit for Propagation Delay, Rise Time, and Fall Time

IF

SW

RM

0.1 μF

Bypass

VCC

350 Ω

VO Monitoring

CL Node

VCM

Pulse Gen

VCM 90%

1 kV

10%

tr

VO (IF = 0 mA)

0V

tf

VOH

2V

VO (IF = 6 mA)

0.8 V

VOL

Figure 14. Test Circuit for Instantaneous Common-Mode Rejection Voltage

©2012 Fairchild Semiconductor Corporation

FOD8160 Rev. 1.0.1

10

www.fairchildsemi.com

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