FQP30N06 View Datasheet(PDF) - Fairchild Semiconductor

Part Name

Description

Manufacturer

FQP30N06

N-Channel QFET® MOSFET

Fairchild Semiconductor 

Figure 12. Gate Charge Test Circuit & Waveform

Same Type

50KΩ

as DUT

12V

200nF

300nF

VGS

10V

VGS

VDS

Qgs

IG = co3nmsAt.

DUT

Qg

Qgd

Charge

V10GVS

Figure 13. Resistive Switching Test Circuit & Waveforms

VDS

VGS

RG

RL

VDD

DUT

VDS

90%

VGS 10%

td(on)

tr

t on

td(off)

tf

t off

V1G0GVSS

tp

Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms

VDS

ID

RG

L

EAS = --21-- L IAS2

------B--V--D--S-S-------

BVDSS - VDD

BVDSS

IAS

VDD

ID (t)

DUT

VDD

VDS (t)

tp

Time

©2000 Fairchild Semiconductor Corporation

5

FQP30N06 Rev. C1

www.fairchildsemi.com

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