HEF40175BP View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
Manufacturer
HEF40175BP Datasheet PDF : 15 Pages
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NXP Semiconductors
HEF40175B
Quad D-type flip-flop
a. Input waveforms
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
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VDD
VI
G
VO
DUT
RT
CL
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b. Test circuit
Fig 6.
Test and measurement data is given in Table 9
Definitions test circuit:
DUT = Device Under Test;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator;
CL = Load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
Table 9. Measurement points and test data
Supply voltage
Input
VDD
5 V to 15 V
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF40175B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 — 14 December 2010
© NXP B.V. 2010. All rights reserved.
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