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HSDL-1001 View Datasheet(PDF) - HP => Agilent Technologies

Part Name
Description
Manufacturer
HSDL-1001
HP
HP => Agilent Technologies HP
HSDL-1001 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Appendix A. Test
Methods
A.1. Background Light and
Electromagnetic Field
There are four ambient
interference conditions in which
the receiver is to operate correctly.
The conditions are to be applied
separately:
1. Electromagnetic field: 3 V/m
maximum (refer to IEC 801-3.
severity level 3 for details)
2. Sunlight: 10 kilolux maximum
at the optical port
This is simulated with an IR
source having a peak wavelength
within the range 850 nm to
900 nm and a spectral width less
than 50 nm biased to provide
490 µW/cm2 (with no modula-
tion) at the optical port. The light
source faces the optical port.
This simulates sunlight within the
IrDA spectral range. The effect
of longer wavelength radiation is
covered by the incandescent
condition.
3. Incandescent Lighting:
1000 lux maximum
This is produced with general
service, tungsten-filament, gas-
filled, inside-frosted lamps in the
60 Watt to 150 Watt range to
generate 1000 lux over the
horizontal surface on which the
equipment under test rests. The
light sources are above the test
area. The source is expected to
have a filament temperature in
the 2700 to 3050 degrees Kelvin
range and a spectral peak in the
850 nm to 1050 nm range.
4. Fluorescent Lighting: 1000 lux
maximum
This is simulated with an IR
source having a peak wavelength
within the range 850 nm to
900 nm and a spectral width of
less than 50 nm biased and
modulated to provide an optical
square wave signal (0 µW/cm2
minimum and 0.3 µW/cm2 peak
amplitude with 10% to 90% rise
and fall times less than or equal
to 100 ns) over the horizontal
surface on which the equipment
under test rests. The light sources
are above the test area. The
frequency of the optical signal is
swept over the frequency range
from 20 kHz to 200 kHz.
Due to the variety of fluorescent
lamps and the range of IR
emissions, this condition is not
expected to cover all circum-
stances. It will provide a common
floor for IrDA operation.
www.semiconductor.agilent.com
Data subject to change.
Copyright © 1999 Agilent Technologies Inc.
5965-5363E (11/99)

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