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IDT71216 View Datasheet(PDF) - Integrated Device Technology

Part Name
Description
Manufacturer
IDT71216 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
IDT71216
BiCMOS 16K x 15 CACHE-TAG RAM
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
AC TEST LOADS
GND to 3.0V
3ns
1.5V
1.5V
See Figs. 1, 2, 3, & 4
3067 tbl 16
Outputs
347
VCCQ
893
30pF *
COMMERCIAL TEMPERATURE RANGE
Tag I/O
347
VCCQ
893
50pF *
Figure 1. AC Test Load
3067 drw 03
Figure 2. Tag I/O AC Test Load
* Including scope and jig capacitance
3067 drw 04
Tag I/O
and
Outputs
347
VCCQ
893
5pF*
Figure 3. AC Test Load
(for tHZ and tLZ parameters )
* Including scope and jig capacitance
6
5
4
t 3
(Typical, ns)
2
3067 drw 05
1
20 30 50
80 100
Capacitance (pF)
3067 drw 06
Figure 4. Lumped Capacitance Load, Typical Derating
14.3
10

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